Oxidation endurance of boron nitride nanotube field emitters

Yenan Song, Dong Hoon Shin, Ki Nam Yun, Cheol Jin Lee, Yoon Ho Song, William I. Milne

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    Boron nitride (BN) nanomaterials have negative electron affinity, which makes BN a promising cold electron emission material. BN nanotube (BNNT) field emitters show excellent oxidation endurance after high temperature thermal annealing at 600 °C in air ambient. There is no damage to the BNNTs after the thermal annealing at a temperature of 600 °C and also no degradation of field emission properties. In this work, the thermal annealed BNNTs exhibit a high maximum emission current density of 8.39 mA/cm2 and robust long-term emission stability. The results reveal that BNNTs can be a promising emitter material for field emission devices under harsh environments.

    Original languageEnglish
    Title of host publicationTechnical Digest - 2014 27th International Vacuum Nanoelectronics Conference, IVNC 2014
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Pages235-236
    Number of pages2
    ISBN (Print)9781479953080
    DOIs
    Publication statusPublished - 2014 Jan 1
    Event2014 27th International Vacuum Nanoelectronics Conference, IVNC 2014 - Engelberg, Switzerland
    Duration: 2014 Jul 62014 Jul 10

    Other

    Other2014 27th International Vacuum Nanoelectronics Conference, IVNC 2014
    Country/TerritorySwitzerland
    CityEngelberg
    Period14/7/614/7/10

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering

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