Oxide double-layer nanocrossbar for ultrahigh-density bipolar resistive memory

  • Seo Hyoung Chang
  • , Shin Buhm Lee
  • , Dae Young Jeon
  • , So Jung Park
  • , Gyu Tae Kim
  • , Sang Mo Yang
  • , Seung Chul Chae
  • , Hyang Keun Yoo
  • , Bo Soo Kang
  • , Myoung Jae Lee
  • , Tae Won Noh*
  • *Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    118 Citations (Scopus)

    Abstract

    A TiO 2/VO 2 oxide double-layer nanocrossbar to overcome the sneak path problem in bipolar resistive memory is proposed. TiO 2 and VO 2 thin films function as a bipolar resistive memory and a bidirectional switch, respectively. The new structure suggests that ultrahigh densities can be achieved with a 2D nanocrossbar array layout. By stacking into a 3D structure, the density can be even higher.

    Original languageEnglish
    Pages (from-to)4063-4067
    Number of pages5
    JournalAdvanced Materials
    Volume23
    Issue number35
    DOIs
    Publication statusPublished - 2011 Sept 15

    Keywords

    • crossbar architecture
    • nanodevices
    • resistance switching
    • sneak path problem
    • titanium dioxide

    ASJC Scopus subject areas

    • General Materials Science
    • Mechanics of Materials
    • Mechanical Engineering

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