Passivation of semi-insulating polycrystalline cdznte films

Ki Hyun Kim; Jae Ho Won; Shin Hang Cho; Jong Hee Suh; Pyong Kon Cho; Jinki Hong; Sun Ung Kim; You Ree Han

doi:10.3938/jkps.53.317

Passivation of semi-insulating polycrystalline cdznte films

Ki Hyun Kim, Jae Ho Won, Shin Hang Cho, Jong Hee Suh, Pyong Kon Cho, Jinki Hong, Sun Ung Kim, You Ree Han

Research output: Contribution to journal › Article › peer-review

10 Citations (Scopus)

Abstract

Surface effects play an important role in the overall performance of X-ray detector. The effects of passivation with (NH₄)₂S on semi-insulating polycrystalline CdZnTe thick films were analyzed with X-ray photoelectron spectroscopy (XPS), photoconductive decay (PCD), noise power spectrum and pulse height spectra measurements. Sulfur passivation with (HN ₄)₂S effectively removes the Teoxide layers on the CdZnTe surface, reduces the surface leakage current and gives higher energy resolution by suppressing 1/f noise.

Original language	English
Pages (from-to)	317-321
Number of pages	5
Journal	Journal of the Korean Physical Society
Volume	53
Issue number	1
DOIs	https://doi.org/10.3938/jkps.53.317
Publication status	Published - 2008 Jul

Keywords

1/f noise
CdTeS
Heterojunction
Inter-pixel resistance
Leakage current
Semi-insulating CdZnTe
Sulfur passivation

ASJC Scopus subject areas

General Physics and Astronomy

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10.3938/jkps.53.317

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title = "Passivation of semi-insulating polycrystalline cdznte films",

abstract = "Surface effects play an important role in the overall performance of X-ray detector. The effects of passivation with (NH4)2S on semi-insulating polycrystalline CdZnTe thick films were analyzed with X-ray photoelectron spectroscopy (XPS), photoconductive decay (PCD), noise power spectrum and pulse height spectra measurements. Sulfur passivation with (HN 4)2S effectively removes the Teoxide layers on the CdZnTe surface, reduces the surface leakage current and gives higher energy resolution by suppressing 1/f noise.",

keywords = "1/f noise, CdTeS, Heterojunction, Inter-pixel resistance, Leakage current, Semi-insulating CdZnTe, Sulfur passivation",

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T1 - Passivation of semi-insulating polycrystalline cdznte films

AU - Kim, Ki Hyun

AU - Won, Jae Ho

AU - Cho, Shin Hang

AU - Suh, Jong Hee

AU - Cho, Pyong Kon

AU - Hong, Jinki

AU - Kim, Sun Ung

AU - Han, You Ree

PY - 2008/7

Y1 - 2008/7

N2 - Surface effects play an important role in the overall performance of X-ray detector. The effects of passivation with (NH4)2S on semi-insulating polycrystalline CdZnTe thick films were analyzed with X-ray photoelectron spectroscopy (XPS), photoconductive decay (PCD), noise power spectrum and pulse height spectra measurements. Sulfur passivation with (HN 4)2S effectively removes the Teoxide layers on the CdZnTe surface, reduces the surface leakage current and gives higher energy resolution by suppressing 1/f noise.

AB - Surface effects play an important role in the overall performance of X-ray detector. The effects of passivation with (NH4)2S on semi-insulating polycrystalline CdZnTe thick films were analyzed with X-ray photoelectron spectroscopy (XPS), photoconductive decay (PCD), noise power spectrum and pulse height spectra measurements. Sulfur passivation with (HN 4)2S effectively removes the Teoxide layers on the CdZnTe surface, reduces the surface leakage current and gives higher energy resolution by suppressing 1/f noise.

KW - 1/f noise

KW - CdTeS

KW - Heterojunction

KW - Inter-pixel resistance

KW - Leakage current

KW - Semi-insulating CdZnTe

KW - Sulfur passivation

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DO - 10.3938/jkps.53.317

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JO - Journal of the Korean Physical Society

JF - Journal of the Korean Physical Society

IS - 1

ER -

Passivation of semi-insulating polycrystalline cdznte films

Abstract

Keywords

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