Patch-based over-exposure correction in image

Yeo Jin Yoon, Dae Hong Lee, Seok Jae Kang, Won Jae Park, Sung Jea Ko

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)


Most of conventional over-exposure correction methods fail to reconstruct the detail information of the overexposed region (OER) in an image. This paper presents a novel method which can effectively reconstruct the texture as well as the luminance and the color of the OER without user interaction. The proposed method is performed based on a patch-based region filling method. In a patch including the over-exposed pixels, new luminance values are progressively estimated according to the luminance variation in the reference patch (RP) which is selected in the well-exposed region. For the color correction of the OER, the color values of the RP are simply copied. Once the OER is completely filled, the resultant image is refined using the Gaussian-based filters. Experimental results demonstrate that the proposed method provides more preferable results than conventional one.

Original languageEnglish
Title of host publicationISCE 2014 - 18th IEEE International Symposium on Consumer Electronics
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9781479945924
Publication statusPublished - 2014
Event18th IEEE International Symposium on Consumer Electronics, ISCE 2014 - Jeju, Korea, Republic of
Duration: 2014 Jun 222014 Jun 25

Publication series

NameProceedings of the International Symposium on Consumer Electronics, ISCE


Other18th IEEE International Symposium on Consumer Electronics, ISCE 2014
Country/TerritoryKorea, Republic of


  • Image enhancement
  • over-exposure correction
  • patch-based processing
  • region filling

ASJC Scopus subject areas

  • Engineering(all)


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