Patch-based over-exposure correction in image

Yeo Jin Yoon; Dae Hong Lee; Seok Jae Kang; Won Jae Park; Sung Jea Ko

doi:10.1109/ISCE.2014.6884423

Patch-based over-exposure correction in image

Yeo Jin Yoon, Dae Hong Lee, Seok Jae Kang, Won Jae Park, Sung Jea Ko

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

2 Citations (Scopus)

Abstract

Most of conventional over-exposure correction methods fail to reconstruct the detail information of the overexposed region (OER) in an image. This paper presents a novel method which can effectively reconstruct the texture as well as the luminance and the color of the OER without user interaction. The proposed method is performed based on a patch-based region filling method. In a patch including the over-exposed pixels, new luminance values are progressively estimated according to the luminance variation in the reference patch (RP) which is selected in the well-exposed region. For the color correction of the OER, the color values of the RP are simply copied. Once the OER is completely filled, the resultant image is refined using the Gaussian-based filters. Experimental results demonstrate that the proposed method provides more preferable results than conventional one.

Original language	English
Title of host publication	ISCE 2014 - 18th IEEE International Symposium on Consumer Electronics
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Print)	9781479945924
DOIs	https://doi.org/10.1109/ISCE.2014.6884423
Publication status	Published - 2014
Event	18th IEEE International Symposium on Consumer Electronics, ISCE 2014 - Jeju, Korea, Republic of Duration: 2014 Jun 22 → 2014 Jun 25

Publication series

Name	Proceedings of the International Symposium on Consumer Electronics, ISCE

Other

Other	18th IEEE International Symposium on Consumer Electronics, ISCE 2014
Country/Territory	Korea, Republic of
City	Jeju
Period	14/6/22 → 14/6/25

Keywords

Image enhancement
over-exposure correction
patch-based processing
region filling

ASJC Scopus subject areas

General Engineering

Access to Document

10.1109/ISCE.2014.6884423

Cite this

Yoon, Y. J., Lee, D. H., Kang, S. J., Park, W. J., & Ko, S. J. (2014). Patch-based over-exposure correction in image. In ISCE 2014 - 18th IEEE International Symposium on Consumer Electronics Article 6884423 (Proceedings of the International Symposium on Consumer Electronics, ISCE). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISCE.2014.6884423

Patch-based over-exposure correction in image. / Yoon, Yeo Jin; Lee, Dae Hong; Kang, Seok Jae et al.
ISCE 2014 - 18th IEEE International Symposium on Consumer Electronics. Institute of Electrical and Electronics Engineers Inc., 2014. 6884423 (Proceedings of the International Symposium on Consumer Electronics, ISCE).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Yoon, YJ, Lee, DH, Kang, SJ, Park, WJ & Ko, SJ 2014, Patch-based over-exposure correction in image. in ISCE 2014 - 18th IEEE International Symposium on Consumer Electronics., 6884423, Proceedings of the International Symposium on Consumer Electronics, ISCE, Institute of Electrical and Electronics Engineers Inc., 18th IEEE International Symposium on Consumer Electronics, ISCE 2014, Jeju, Korea, Republic of, 14/6/22. https://doi.org/10.1109/ISCE.2014.6884423

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abstract = "Most of conventional over-exposure correction methods fail to reconstruct the detail information of the overexposed region (OER) in an image. This paper presents a novel method which can effectively reconstruct the texture as well as the luminance and the color of the OER without user interaction. The proposed method is performed based on a patch-based region filling method. In a patch including the over-exposed pixels, new luminance values are progressively estimated according to the luminance variation in the reference patch (RP) which is selected in the well-exposed region. For the color correction of the OER, the color values of the RP are simply copied. Once the OER is completely filled, the resultant image is refined using the Gaussian-based filters. Experimental results demonstrate that the proposed method provides more preferable results than conventional one.",

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N2 - Most of conventional over-exposure correction methods fail to reconstruct the detail information of the overexposed region (OER) in an image. This paper presents a novel method which can effectively reconstruct the texture as well as the luminance and the color of the OER without user interaction. The proposed method is performed based on a patch-based region filling method. In a patch including the over-exposed pixels, new luminance values are progressively estimated according to the luminance variation in the reference patch (RP) which is selected in the well-exposed region. For the color correction of the OER, the color values of the RP are simply copied. Once the OER is completely filled, the resultant image is refined using the Gaussian-based filters. Experimental results demonstrate that the proposed method provides more preferable results than conventional one.

AB - Most of conventional over-exposure correction methods fail to reconstruct the detail information of the overexposed region (OER) in an image. This paper presents a novel method which can effectively reconstruct the texture as well as the luminance and the color of the OER without user interaction. The proposed method is performed based on a patch-based region filling method. In a patch including the over-exposed pixels, new luminance values are progressively estimated according to the luminance variation in the reference patch (RP) which is selected in the well-exposed region. For the color correction of the OER, the color values of the RP are simply copied. Once the OER is completely filled, the resultant image is refined using the Gaussian-based filters. Experimental results demonstrate that the proposed method provides more preferable results than conventional one.

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Patch-based over-exposure correction in image

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Keywords

ASJC Scopus subject areas

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