Abstract
The grain-boundary resistivity of CaSi2O5-dropped 8 mol%-yttria-stabilized zirconia (8YSZ) was determined by impedance spectroscopy using sub-millimeter-scale electrodes. During sintering, a liquid that formed at the top surface of the specimen penetrated into the 8YSZ and induced enhanced grain growth near the surface region. The grain-boundary resistivity of the specimen surface was observed to be 150 times higher than that of the interior. The deterioration of the grain-boundary conductivity was explained in terms of the presence of an intergranular siliceous phase.
Original language | English |
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Pages (from-to) | 219-222 |
Number of pages | 4 |
Journal | Materials Science and Engineering: B |
Volume | 108 |
Issue number | 3 |
DOIs | |
Publication status | Published - 2004 May 15 |
Bibliographical note
Funding Information:The work is supported by the Creative Research Initiatives of the Korean Ministry of Science and Technology.
Keywords
- CaSiO-dropped 8YSZ
- Distribution of siliceous grain-boundary phase
- Grain-boundary resistivity
- Impedance spectroscopy
- Sintering
ASJC Scopus subject areas
- General Materials Science
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering