Abstract
In recent times, there has been a global increase in the building integrated photovoltaic (BIPV) system market. In addition, the capacity for aesthetic purposed coloured BIPV system integration has also increased. The performance of the coloured BIPV system is measured with Plane of Array (PoA) irradiance using the expected output power as a variable. In this paper, the output power was calculated based on the installation conditions of the sensor and the configuration of the BIPV system. The expected power of the PV system was calculated using the PV performance analysis program PVsyst, a simulation tool. To analyze the performance ratio relative to the irradiance data, the simulation results were compared with the monitoring data. The mean bias error (MBE) between the simulated data and the measured output power of the BIPV system was determined based on the installation condition of the input sensor and configuration of the BIPV system. The MBE values of output power dependent on sensor reliability showed a maximum of −19.44 % and a minimum of −1.4 %. Also, the calculated performance of the coloured BIPV system was 67.7 %, 71.6 %, and 67.7 %, respectively.
Original language | English |
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Article number | 114704 |
Journal | Microelectronics Reliability |
Volume | 138 |
DOIs | |
Publication status | Published - 2022 Nov |
Bibliographical note
Funding Information:This research was supported by the Korea Institute of Energy Technology Evaluation and Planning (KETEP) and the Ministry of Trade, Industry and Energy, Korea (MOTIE) (No. 20213091010020 ). This research was also supported by the Korea Institute of Energy Technology Evaluation and Planning (KETEP) and the Ministry of Trade, Industry and Energy, Korea (MOTIE) (No. 20219410100050 ).
Publisher Copyright:
© 2022
Keywords
- Coloured BIPV system
- PVsyst
- Performance analysis
- Performance reliability
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Condensed Matter Physics
- Safety, Risk, Reliability and Quality
- Surfaces, Coatings and Films
- Electrical and Electronic Engineering