Phase-contrast hard X-ray microscopy using synchrotron radiation for the diagnosis of onychomycosis

Onseok Lee; Seunghan Ha; Gunwoo Lee; Jaeyoung Kim; Jungyun Huang; Kyeongsik Jin; Chil Hwan Oh

doi:10.1002/jemt.20857

Phase-contrast hard X-ray microscopy using synchrotron radiation for the diagnosis of onychomycosis

Onseok Lee, Seunghan Ha, Gunwoo Lee, Jaeyoung Kim, Jungyun Huang, Kyeongsik Jin, Chil Hwan Oh

Research output: Contribution to journal › Article › peer-review

11 Citations (Scopus)

Abstract

Onychomycosis, or fungal infection of the nail, is a disease seen frequently in clinical settings. However, the rates of positive identification using potassium hydroxide preparations or fungal cultures are relatively low. Precise diagnosis is possible via histopathologic examination to monitor the existence of fungus and performance of a fungal culture for confirmation. Phase-contrast hard X-ray microscopy using synchrotron radiation provides 70-nm spatial resolution and enables imaging of minute internal cellular structures. This study confirms the feasibility of diagnosing onychomycosis using a phase-contrast hard X-ray microscope developed at 1B2 beam line using a Pohang light source. Microsc. Res. Tech. 73:1110-1114, 2010.

Original language	English
Pages (from-to)	1110-1114
Number of pages	5
Journal	Microscopy Research and Technique
Volume	73
Issue number	12
DOIs	https://doi.org/10.1002/jemt.20857
Publication status	Published - 2010 Dec 1

Keywords

Onychomycosis
Phase-contrast X-ray
Synchrotron

ASJC Scopus subject areas

Anatomy
Histology
Instrumentation
Medical Laboratory Technology

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10.1002/jemt.20857

Cite this

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abstract = "Onychomycosis, or fungal infection of the nail, is a disease seen frequently in clinical settings. However, the rates of positive identification using potassium hydroxide preparations or fungal cultures are relatively low. Precise diagnosis is possible via histopathologic examination to monitor the existence of fungus and performance of a fungal culture for confirmation. Phase-contrast hard X-ray microscopy using synchrotron radiation provides 70-nm spatial resolution and enables imaging of minute internal cellular structures. This study confirms the feasibility of diagnosing onychomycosis using a phase-contrast hard X-ray microscope developed at 1B2 beam line using a Pohang light source. Microsc. Res. Tech. 73:1110-1114, 2010.",

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AU - Lee, Onseok

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AU - Lee, Gunwoo

AU - Kim, Jaeyoung

AU - Huang, Jungyun

AU - Jin, Kyeongsik

AU - Oh, Chil Hwan

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AB - Onychomycosis, or fungal infection of the nail, is a disease seen frequently in clinical settings. However, the rates of positive identification using potassium hydroxide preparations or fungal cultures are relatively low. Precise diagnosis is possible via histopathologic examination to monitor the existence of fungus and performance of a fungal culture for confirmation. Phase-contrast hard X-ray microscopy using synchrotron radiation provides 70-nm spatial resolution and enables imaging of minute internal cellular structures. This study confirms the feasibility of diagnosing onychomycosis using a phase-contrast hard X-ray microscope developed at 1B2 beam line using a Pohang light source. Microsc. Res. Tech. 73:1110-1114, 2010.

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Phase-contrast hard X-ray microscopy using synchrotron radiation for the diagnosis of onychomycosis

Abstract

Keywords

ASJC Scopus subject areas

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