Abstract
Cobalt ferrite/metal composite thin films with a saturation magnetization (Ms) of ∼0.729 Weber m-2 were prepared by a reactive sputtering method. The Ms of the thin films increased with increasing substrate temperature. The microstructures of the thin films were identified by a convergent beam electron diffraction method. For the thin films deposited at high substrate temperatures (> 300 °C), CoxFe1-x (x ≈ 0.62) metal alloys were separated from the cobalt ferrite matrix. A cobalt ferrite phase was determined as CoFe2O4 with a cubic structure (a0=0.839 nm) and a space group of Fd3m, while a metal phase CoxFe1-x (x ≈ 0.62) with a b.c.c. structure (a 0=0.289 nm) and a space group of Im3m.
Original language | English |
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Pages (from-to) | 323-326 |
Number of pages | 4 |
Journal | Journal of Materials Science: Materials in Electronics |
Volume | 9 |
Issue number | 5 |
DOIs | |
Publication status | Published - 1998 Oct |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Condensed Matter Physics
- Electrical and Electronic Engineering