Phase noise calculation and variability analysis of RFCMOS LC oscillator based on physics-based mixed-mode simulation

Sung Min Hong; Yongho Oh; Namhyung Kim; Jae Sung Rieh

doi:10.1016/j.sse.2012.07.022

Phase noise calculation and variability analysis of RFCMOS LC oscillator based on physics-based mixed-mode simulation

Sung Min Hong, Yongho Oh, Namhyung Kim, Jae Sung Rieh

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Abstract

A mixed-mode technology computer-aided design framework, which can evaluate the periodic steady-state solution of the oscillator efficiently, has been applied to an RFCMOS LC oscillator. Physics-based simulation of active devices makes it possible to link the internal parameters inside the devices and the performance of the oscillator directly. The phase noise of the oscillator is simulated with physics-based device simulation and the results are compared with the experimental data. Moreover, the statistical effect of the random dopant fluctuation on the oscillation frequency is investigated.

Original language	English
Pages (from-to)	152-158
Number of pages	7
Journal	Solid-State Electronics
Volume	79
DOIs	https://doi.org/10.1016/j.sse.2012.07.022
Publication status	Published - 2013 Jan

Bibliographical note

Funding Information:
The authors would like to thank Prof. C. Jungemann of Bundeswehr University (Germany) for supporting the computing resources. The authors also appreciate the careful review and precious suggestions made by the reviewers. This work was partly supported by the NRF grant funded by the Korea government (MEST) (No. 2011-0020128 ).

Keywords

Oscillator
Phase noise
Semiconductor device modeling
Semiconductor device noise

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Electrical and Electronic Engineering
Materials Chemistry

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10.1016/j.sse.2012.07.022

Cite this

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title = "Phase noise calculation and variability analysis of RFCMOS LC oscillator based on physics-based mixed-mode simulation",

abstract = "A mixed-mode technology computer-aided design framework, which can evaluate the periodic steady-state solution of the oscillator efficiently, has been applied to an RFCMOS LC oscillator. Physics-based simulation of active devices makes it possible to link the internal parameters inside the devices and the performance of the oscillator directly. The phase noise of the oscillator is simulated with physics-based device simulation and the results are compared with the experimental data. Moreover, the statistical effect of the random dopant fluctuation on the oscillation frequency is investigated.",

keywords = "Oscillator, Phase noise, Semiconductor device modeling, Semiconductor device noise",

author = "Hong, {Sung Min} and Yongho Oh and Namhyung Kim and Rieh, {Jae Sung}",

note = "Funding Information: The authors would like to thank Prof. C. Jungemann of Bundeswehr University (Germany) for supporting the computing resources. The authors also appreciate the careful review and precious suggestions made by the reviewers. This work was partly supported by the NRF grant funded by the Korea government (MEST) (No. 2011-0020128 ). ",

year = "2013",

month = jan,

doi = "10.1016/j.sse.2012.07.022",

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journal = "Solid-State Electronics",

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AU - Hong, Sung Min

AU - Oh, Yongho

AU - Kim, Namhyung

AU - Rieh, Jae Sung

N1 - Funding Information: The authors would like to thank Prof. C. Jungemann of Bundeswehr University (Germany) for supporting the computing resources. The authors also appreciate the careful review and precious suggestions made by the reviewers. This work was partly supported by the NRF grant funded by the Korea government (MEST) (No. 2011-0020128 ).

PY - 2013/1

Y1 - 2013/1

N2 - A mixed-mode technology computer-aided design framework, which can evaluate the periodic steady-state solution of the oscillator efficiently, has been applied to an RFCMOS LC oscillator. Physics-based simulation of active devices makes it possible to link the internal parameters inside the devices and the performance of the oscillator directly. The phase noise of the oscillator is simulated with physics-based device simulation and the results are compared with the experimental data. Moreover, the statistical effect of the random dopant fluctuation on the oscillation frequency is investigated.

AB - A mixed-mode technology computer-aided design framework, which can evaluate the periodic steady-state solution of the oscillator efficiently, has been applied to an RFCMOS LC oscillator. Physics-based simulation of active devices makes it possible to link the internal parameters inside the devices and the performance of the oscillator directly. The phase noise of the oscillator is simulated with physics-based device simulation and the results are compared with the experimental data. Moreover, the statistical effect of the random dopant fluctuation on the oscillation frequency is investigated.

KW - Oscillator

KW - Phase noise

KW - Semiconductor device modeling

KW - Semiconductor device noise

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M3 - Article

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SN - 0038-1101

VL - 79

SP - 152

EP - 158

JO - Solid-State Electronics

JF - Solid-State Electronics

ER -

Phase noise calculation and variability analysis of RFCMOS LC oscillator based on physics-based mixed-mode simulation

Abstract

Bibliographical note

Keywords

ASJC Scopus subject areas

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