A mixed-mode technology computer-aided design framework, which can evaluate the periodic steady-state solution of the oscillator efficiently, has been applied to an RFCMOS LC oscillator. Physics-based simulation of active devices makes it possible to link the internal parameters inside the devices and the performance of the oscillator directly. The phase noise of the oscillator is simulated with physics-based device simulation and the results are compared with the experimental data. Moreover, the statistical effect of the random dopant fluctuation on the oscillation frequency is investigated.
Bibliographical noteFunding Information:
The authors would like to thank Prof. C. Jungemann of Bundeswehr University (Germany) for supporting the computing resources. The authors also appreciate the careful review and precious suggestions made by the reviewers. This work was partly supported by the NRF grant funded by the Korea government (MEST) (No. 2011-0020128 ).
- Phase noise
- Semiconductor device modeling
- Semiconductor device noise
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering
- Materials Chemistry