Photoelectromagnetic effects on electron and proton irradiated CuInSe2 thin films

Hae Seok Lee; Hiroshi Okada; Akihiro Wakahara; Akira Yoshida; Takeshi Ohshima; Hisayoshi Itoh

doi:10.1063/1.1579545

Photoelectromagnetic effects on electron and proton irradiated CuInSe₂ thin films

Hae Seok Lee, Hiroshi Okada, Akihiro Wakahara, Akira Yoshida, Takeshi Ohshima, Hisayoshi Itoh

Research output: Contribution to journal › Article › peer-review

11 Citations (Scopus)

Abstract

The photoelectromagnetic effects on electron and proton irradiated CuInSe₂ (CIS) thin films were investigated by using radio frequency sputtering method. The damage constant was estimated from the change in diffusion length before and after irradiation. It was found that the diffusion length decreased due to irradiation-induced defects when the electron fluence exceeded 1×10¹⁶cm^-2.

Original language	English
Pages (from-to)	276-278
Number of pages	3
Journal	Journal of Applied Physics
Volume	94
Issue number	1
DOIs	https://doi.org/10.1063/1.1579545
Publication status	Published - 2003 Jul 1
Externally published	Yes

Bibliographical note

Copyright:
Copyright 2008 Elsevier B.V., All rights reserved.

ASJC Scopus subject areas

Physics and Astronomy(all)

Access to Document

10.1063/1.1579545

Cite this

@article{f0a80c453e564b43a5c017cc2b92881c,

title = "Photoelectromagnetic effects on electron and proton irradiated CuInSe2 thin films",

abstract = "The photoelectromagnetic effects on electron and proton irradiated CuInSe2 (CIS) thin films were investigated by using radio frequency sputtering method. The damage constant was estimated from the change in diffusion length before and after irradiation. It was found that the diffusion length decreased due to irradiation-induced defects when the electron fluence exceeded 1×1016cm-2.",

author = "Lee, {Hae Seok} and Hiroshi Okada and Akihiro Wakahara and Akira Yoshida and Takeshi Ohshima and Hisayoshi Itoh",

year = "2003",

month = jul,

day = "1",

doi = "10.1063/1.1579545",

language = "English",

volume = "94",

pages = "276--278",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics Publising LLC",

number = "1",

}

TY - JOUR

T1 - Photoelectromagnetic effects on electron and proton irradiated CuInSe2 thin films

AU - Lee, Hae Seok

AU - Okada, Hiroshi

AU - Wakahara, Akihiro

AU - Yoshida, Akira

AU - Ohshima, Takeshi

AU - Itoh, Hisayoshi

PY - 2003/7/1

Y1 - 2003/7/1

N2 - The photoelectromagnetic effects on electron and proton irradiated CuInSe2 (CIS) thin films were investigated by using radio frequency sputtering method. The damage constant was estimated from the change in diffusion length before and after irradiation. It was found that the diffusion length decreased due to irradiation-induced defects when the electron fluence exceeded 1×1016cm-2.

AB - The photoelectromagnetic effects on electron and proton irradiated CuInSe2 (CIS) thin films were investigated by using radio frequency sputtering method. The damage constant was estimated from the change in diffusion length before and after irradiation. It was found that the diffusion length decreased due to irradiation-induced defects when the electron fluence exceeded 1×1016cm-2.

UR - http://www.scopus.com/inward/record.url?scp=0041840549&partnerID=8YFLogxK

U2 - 10.1063/1.1579545

DO - 10.1063/1.1579545

M3 - Article

AN - SCOPUS:0041840549

SN - 0021-8979

VL - 94

SP - 276

EP - 278

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 1

ER -