TY - GEN
T1 - Photosensitivity analysis of n-ZnO/p-SiC heterojunction structures
AU - Jung, Ji Chul
AU - Kang, Min Seok
AU - Kim, Ji Hong
AU - Lee, Jin Woo
AU - Moon, Byung Moo
AU - Koo, Sang Mo
PY - 2011
Y1 - 2011
N2 - Among the wide band gap semiconductor materials that have drawn a lot of attention recently, ZnO and SiC are seriously considered as materials for emerging electronics applications. ZnO has received attention for its application for UV light-emitters, transparent high power electronics, sensors, piezo electric transducers, and solar cells, because of its high chemical stability, non-toxicity, low cost and high optical band gap of 3.37 eV. 4H-SiC has very a small lattice mismatch to ZnO (5%), a wide band gap (3.2 eV) with excellent thermal properties, and thus suitable for applications such as optoelectronic, high-power, high-frequency, and high-temperature devices. In addition, its useful properties include the existence of the availability of large area substrate, and a high electron saturation velocity.
AB - Among the wide band gap semiconductor materials that have drawn a lot of attention recently, ZnO and SiC are seriously considered as materials for emerging electronics applications. ZnO has received attention for its application for UV light-emitters, transparent high power electronics, sensors, piezo electric transducers, and solar cells, because of its high chemical stability, non-toxicity, low cost and high optical band gap of 3.37 eV. 4H-SiC has very a small lattice mismatch to ZnO (5%), a wide band gap (3.2 eV) with excellent thermal properties, and thus suitable for applications such as optoelectronic, high-power, high-frequency, and high-temperature devices. In addition, its useful properties include the existence of the availability of large area substrate, and a high electron saturation velocity.
UR - http://www.scopus.com/inward/record.url?scp=84863121478&partnerID=8YFLogxK
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U2 - 10.1109/ISDRS.2011.6135312
DO - 10.1109/ISDRS.2011.6135312
M3 - Conference contribution
AN - SCOPUS:84863121478
SN - 9781457717550
T3 - 2011 International Semiconductor Device Research Symposium, ISDRS 2011
BT - 2011 International Semiconductor Device Research Symposium, ISDRS 2011
T2 - 2011 International Semiconductor Device Research Symposium, ISDRS 2011
Y2 - 7 December 2011 through 9 December 2011
ER -