Piezoelectric properties of highly oriented lead-free Na 0.5K 0.5NbO 3 films as determined using piezoelectric force microscopy

J. S. Kim; I. R. Hwang; S. H. Hong; J. H. Lee; B. H. Park; Ahn Cheol Woo; Nahm Sahn

Piezoelectric properties of highly oriented lead-free Na _0.5K _0.5NbO ₃ films as determined using piezoelectric force microscopy

J. S. Kim, I. R. Hwang, S. H. Hong, J. H. Lee, B. H. Park, Ahn Cheol Woo, Nahm Sahn

Department of Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

22 Citations (Scopus)

Abstract

We have deposited highly oriented Na _0.5K _0.5NbO ₃ (NKN) films on LaMnO ₃/LaAlO ₃ (001) substrates by using pulsed laser deposition with a stoichiometric ceramic target. X-ray diffraction (XRD) analysis and electron probe microanalyzer (EPMA) show c-axis-oriented growth of stoichiometric NKN films. In order to investigate the local piezoelectric properties of our NKN films, we have measured the piezoelectric constant (das) values for the NKN films by using a piezoelectric force microscope modified using an atomic force microscope and a lock-in amplifier. We have confirmed that the piezoelectric constant of ∼40 pm/V for our highly oriented NKN film grown on a LaMnO ₃/LaAlO ₃ substrate is comparable to that of an epitaxially grown PbZr _0.3Ti _0.7O ₃ film grown on the same structure.

Original language	English
Pages (from-to)	1583-1587
Number of pages	5
Journal	Journal of the Korean Physical Society
Volume	48
Issue number	6
Publication status	Published - 2006 Jun

Keywords

Lead-free piezoelectric material
NKN
PFM
PLD
Piezoelectric constant

ASJC Scopus subject areas

Physics and Astronomy(all)

Cite this

@article{60c1b6244dcb47da9c321c06ae1bf38e,

title = "Piezoelectric properties of highly oriented lead-free Na 0.5K 0.5NbO 3 films as determined using piezoelectric force microscopy",

abstract = "We have deposited highly oriented Na 0.5K 0.5NbO 3 (NKN) films on LaMnO 3/LaAlO 3 (001) substrates by using pulsed laser deposition with a stoichiometric ceramic target. X-ray diffraction (XRD) analysis and electron probe microanalyzer (EPMA) show c-axis-oriented growth of stoichiometric NKN films. In order to investigate the local piezoelectric properties of our NKN films, we have measured the piezoelectric constant (das) values for the NKN films by using a piezoelectric force microscope modified using an atomic force microscope and a lock-in amplifier. We have confirmed that the piezoelectric constant of ∼40 pm/V for our highly oriented NKN film grown on a LaMnO 3/LaAlO 3 substrate is comparable to that of an epitaxially grown PbZr 0.3Ti 0.7O 3 film grown on the same structure.",

keywords = "Lead-free piezoelectric material, NKN, PFM, PLD, Piezoelectric constant",

author = "Kim, {J. S.} and Hwang, {I. R.} and Hong, {S. H.} and Lee, {J. H.} and Park, {B. H.} and Woo, {Ahn Cheol} and Nahm Sahn",

year = "2006",

month = jun,

language = "English",

volume = "48",

pages = "1583--1587",

journal = "Journal of the Korean Physical Society",

issn = "0374-4884",

publisher = "Korean Physical Society",

number = "6",

}

TY - JOUR

T1 - Piezoelectric properties of highly oriented lead-free Na 0.5K 0.5NbO 3 films as determined using piezoelectric force microscopy

AU - Kim, J. S.

AU - Hwang, I. R.

AU - Hong, S. H.

AU - Lee, J. H.

AU - Park, B. H.

AU - Woo, Ahn Cheol

AU - Sahn, Nahm

PY - 2006/6

Y1 - 2006/6

N2 - We have deposited highly oriented Na 0.5K 0.5NbO 3 (NKN) films on LaMnO 3/LaAlO 3 (001) substrates by using pulsed laser deposition with a stoichiometric ceramic target. X-ray diffraction (XRD) analysis and electron probe microanalyzer (EPMA) show c-axis-oriented growth of stoichiometric NKN films. In order to investigate the local piezoelectric properties of our NKN films, we have measured the piezoelectric constant (das) values for the NKN films by using a piezoelectric force microscope modified using an atomic force microscope and a lock-in amplifier. We have confirmed that the piezoelectric constant of ∼40 pm/V for our highly oriented NKN film grown on a LaMnO 3/LaAlO 3 substrate is comparable to that of an epitaxially grown PbZr 0.3Ti 0.7O 3 film grown on the same structure.

AB - We have deposited highly oriented Na 0.5K 0.5NbO 3 (NKN) films on LaMnO 3/LaAlO 3 (001) substrates by using pulsed laser deposition with a stoichiometric ceramic target. X-ray diffraction (XRD) analysis and electron probe microanalyzer (EPMA) show c-axis-oriented growth of stoichiometric NKN films. In order to investigate the local piezoelectric properties of our NKN films, we have measured the piezoelectric constant (das) values for the NKN films by using a piezoelectric force microscope modified using an atomic force microscope and a lock-in amplifier. We have confirmed that the piezoelectric constant of ∼40 pm/V for our highly oriented NKN film grown on a LaMnO 3/LaAlO 3 substrate is comparable to that of an epitaxially grown PbZr 0.3Ti 0.7O 3 film grown on the same structure.

KW - Lead-free piezoelectric material

KW - NKN

KW - PFM

KW - PLD

KW - Piezoelectric constant

UR - http://www.scopus.com/inward/record.url?scp=33746085986&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:33746085986

SN - 0374-4884

VL - 48

SP - 1583

EP - 1587

JO - Journal of the Korean Physical Society

JF - Journal of the Korean Physical Society

IS - 6

ER -

Piezoelectric properties of highly oriented lead-free Na _0.5K _0.5NbO ₃ films as determined using piezoelectric force microscopy

Abstract

Keywords

ASJC Scopus subject areas

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