Abstract
In this paper, we propose a method to estimate plant leaf area using image segmentation. In the field of horticulture, destructive analysis is mainly made to measure leaf area, which is required for plant growth measurement. But it has the disadvantage that the plant cannot be used again after analysis. the proposed image based leaf area measurement is non-destructive, and it does not take much time compared with destructive analysis. Leaves in a plant image are first segmented, and then, their correlation to actual leaf area is analyzed. Experimental results show that we can easily predict actual leaf area from plant images.
Original language | English |
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Title of host publication | ITC-CSCC 2022 - 37th International Technical Conference on Circuits/Systems, Computers and Communications |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 996-998 |
Number of pages | 3 |
ISBN (Electronic) | 9781665485593 |
DOIs | |
Publication status | Published - 2022 |
Event | 37th International Technical Conference on Circuits/Systems, Computers and Communications, ITC-CSCC 2022 - Phuket, Thailand Duration: 2022 Jul 5 → 2022 Jul 8 |
Publication series
Name | ITC-CSCC 2022 - 37th International Technical Conference on Circuits/Systems, Computers and Communications |
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Conference
Conference | 37th International Technical Conference on Circuits/Systems, Computers and Communications, ITC-CSCC 2022 |
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Country/Territory | Thailand |
City | Phuket |
Period | 22/7/5 → 22/7/8 |
Bibliographical note
Funding Information:ACKNOWLEDGMENT This work is supported by the National Research Foundation of Korea (NRF) grant funded by the Korea government (MSIT) (No. 2020R1A4A4079705).
Publisher Copyright:
© 2022 IEEE.
Keywords
- Leaf area
- Linear regression
- Plant image
- Segmentation
ASJC Scopus subject areas
- Information Systems
- Electrical and Electronic Engineering
- Artificial Intelligence
- Computer Networks and Communications
- Computer Science Applications
- Hardware and Architecture