Abstract
Nowadays, security ICs such as cryptographic modules, TPMs (Trust Platform Modules), connected car ICs, and smart card protection methods have been enhanced due to the introduction of a variety of new attack methods. Additionally, their protection mechanisms are continuously being developed and evaluated. For these reasons, attacking or hacking security chips is now more difficult than it ever has been. Nevertheless, IC failure analysis tools are being greatly improved, with many developers using them. Additionally, in using these tools, many cases involve analyzing the integrated circuit. By exploiting this analysis, attackers can perform invasive attacks [1] or hack the IC from the backside more easily than ever before. However, due to the structure of an IC, making a circuit on the back side of the silicon is more difficult than doing so on the front side. In order to resolve this issue, this paper proposes a practical silicon-backside-protection method that can protect the IC from backside attacks while minimizing its size and increasing its coverage. The proposed method uses capacitance located between the metal-layer which is unused for routing, and uses it for a passive shield (dummy shield) area.
Original language | English |
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Pages (from-to) | 577-584 |
Number of pages | 8 |
Journal | Journal of Semiconductor Technology and Science |
Volume | 19 |
Issue number | 6 |
DOIs | |
Publication status | Published - 2019 Dec |
Bibliographical note
Funding Information:This work was supported by Institute for Information & communications Technology Promotion (IITP) grant funded by the Korea government (MSIP)(IITP-2017-0-00184, Self-Learning Cyber Immune Technology Development)
Funding Information:
This work was supported by Institute for Information & communications Technology Promotion (IITP) grant funded by the Korea government (MSIP)(IITP-2017-0-00184, Self-Learning Cyber Immune Technology Development).
Publisher Copyright:
© 2019, Institute of Electronics Engineers of Korea. All rights reserved.
Keywords
- Abnormally detection
- Active shield
- Connected car
- Integrated circuit attack
- Passive shield
- Secure design
- Secure shield
- Silicon-backside protection
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering