Abstract
The influence that trace concentrations of SiO2 have on improving grain-boundary conduction via precursor scavenging using additional heat treatment at 1200 °C for 40 h before sintering was investigated. At a SiO2-impurity level (SIL) ≤ 160 ppm by weight, the grain-boundary resistivity (ρgb) decreased to 20% of its value, while no improvement in grain-boundary conduction was found at a SIL ≥ 310 ppm. The correlation between the resistance per unit grain-boundary area, ρgb, and average grain size indicated that the inhomogeneous distribution of the siliceous phase in the sample with a SIL ≥ 310 ppm hampered the scavenging reaction.
| Original language | English |
|---|---|
| Pages (from-to) | 2377-2383 |
| Number of pages | 7 |
| Journal | Journal of Materials Research |
| Volume | 16 |
| Issue number | 8 |
| DOIs | |
| Publication status | Published - 2001 Aug |
| Externally published | Yes |
Bibliographical note
Funding Information:J-H.L. expresses his thanks to Japan International Science and Technology Exchange Center (JISTEC), and Japan Science and Technology Corporation (JST) of Japan for a Science and Technology (STA) fellowship.
ASJC Scopus subject areas
- General Materials Science
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering