Prediction model based multi-profile monitoring for manufacturing process management

Seung Hwan Park, Cheong Sool Park, Jun Geol Baek

    Research output: Contribution to journalArticlepeer-review

    2 Citations (Scopus)

    Abstract

    In an advanced manufacturing environment, the analysis of profile data collected from the process equipment is a critical issue in improving process efficiency. In particular, multi-profile monitoring is essential for process control because an advanced manufacturing process consists of numerous pieces of equipment and their related sensors. The main goal of this study is to build a monitoring chart using a Profile Integrated Measure (PIM) from multi-profile data in order to observe an overall condition of various points in the process. To deploy the proposed algorithm, multi-profile data needed to be preprocessed and applied to the prediction model. The PIM is calculated from the prediction model and reflects the relationships between the multi-profile data property, which has normal/abnormal states. The proposed algorithm constructs a model using the PIM of a normal state and identifies the performance of the model. Experiments with the simulation datasets modified from the manufacturing process validate the effectiveness and applicability of the proposed algorithm.

    Original languageEnglish
    Pages (from-to)394-406
    Number of pages13
    JournalInternational Journal of Industrial Engineering : Theory Applications and Practice
    Volume26
    Issue number3
    Publication statusPublished - 2019

    Bibliographical note

    Funding Information:
    This work was supported by the National Research Foundation of Korea (NRF) grant funded by the Korea government (MSIT) (NRF-2019R1A2C2005949). This work was supported by BK21 Plus program (Big Data in Manufacturing and Logistics Systems, Korea University) and by Samsung Electronics Co., Ltd. Also, this work was supported by the National Research Foundation of Korea (NRF) grant funded by the Korea government (MSIT) (NRF-2019R1G1A1004084).

    Funding Information:
    This work was supported by the National Research Foundation of Korea (NRF) grant funded by the Korea government (MSIT) (NRF-2019R1A2C2005949). This work was supported by BK21 Plus program (Big Data in Manufacturing and Logistics Systems, Korea University) and by Samsung Electronics Co., Ltd. Also, this work was supported by the National Research Foundation of Korea (NRF) grant funded by the Korea government (MSIT) (NRF- 2019R1G1A1004084).

    Publisher Copyright:
    © 2019 University of Cincinnati. All rights reserved.

    Keywords

    • Manufacturing process simulation
    • Multi-profile
    • Prediction model
    • Profile integrated measure

    ASJC Scopus subject areas

    • Industrial and Manufacturing Engineering

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