Preparation of CuIn(S,Se)2 thin films by thermal crystallization in sulfur and selenium atmosphere

T. Yamaguchi; T. Naoyama; H. S. Lee; A. Yoshida; T. Kobata; S. Niiyama; T. Nakamura

doi:10.1016/S0022-3697(03)00106-9

Preparation of CuIn(S,Se)₂ thin films by thermal crystallization in sulfur and selenium atmosphere

T. Yamaguchi, T. Naoyama, H. S. Lee, A. Yoshida, T. Kobata, S. Niiyama, T. Nakamura

Research output: Contribution to journal › Article › peer-review

6 Citations (Scopus)

Abstract

Thin films of CuIn(S,Se)₂ were prepared by thermal crystallization process for photovoltaic device applications and their properties were investigated. From EPMA analysis, S/(S+Se) atomic ratio in the thin films was changed from 0.18 to 1.0 with increasing the S/(S+Se) vapor ratio in the quartz ampoule. X-ray diffraction studies revealed that the thin films had a chalcopyrite CuIn(S,Se)₂ structure and the preferred orientation to the 112 plane. The SEM images showed that the grain sizes in CuIn(S,Se)₂ thin films decreased with the increase in the S/(S+Se) atomic ratio.

Original language	English
Pages (from-to)	1831-1834
Number of pages	4
Journal	Journal of Physics and Chemistry of Solids
Volume	64
Issue number	9-10
DOIs	https://doi.org/10.1016/S0022-3697(03)00106-9
Publication status	Published - 2003 Sept
Externally published	Yes

Keywords

C. X-ray diffraction

ASJC Scopus subject areas

Chemistry(all)
Materials Science(all)
Condensed Matter Physics

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

Access to Document

10.1016/S0022-3697(03)00106-9

Cite this

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title = "Preparation of CuIn(S,Se)2 thin films by thermal crystallization in sulfur and selenium atmosphere",

abstract = "Thin films of CuIn(S,Se)2 were prepared by thermal crystallization process for photovoltaic device applications and their properties were investigated. From EPMA analysis, S/(S+Se) atomic ratio in the thin films was changed from 0.18 to 1.0 with increasing the S/(S+Se) vapor ratio in the quartz ampoule. X-ray diffraction studies revealed that the thin films had a chalcopyrite CuIn(S,Se)2 structure and the preferred orientation to the 112 plane. The SEM images showed that the grain sizes in CuIn(S,Se)2 thin films decreased with the increase in the S/(S+Se) atomic ratio.",

keywords = "C. X-ray diffraction",

author = "T. Yamaguchi and T. Naoyama and Lee, {H. S.} and A. Yoshida and T. Kobata and S. Niiyama and T. Nakamura",

note = "Funding Information: This study was supported in part by a Grant-in-Aid for Scientific Research from the Ministry of Education, Culture, Sports, Science and Technology in Japan.",

year = "2003",

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doi = "10.1016/S0022-3697(03)00106-9",

language = "English",

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journal = "Journal of Physics and Chemistry of Solids",

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T1 - Preparation of CuIn(S,Se)2 thin films by thermal crystallization in sulfur and selenium atmosphere

AU - Yamaguchi, T.

AU - Naoyama, T.

AU - Lee, H. S.

AU - Yoshida, A.

AU - Kobata, T.

AU - Niiyama, S.

AU - Nakamura, T.

N1 - Funding Information: This study was supported in part by a Grant-in-Aid for Scientific Research from the Ministry of Education, Culture, Sports, Science and Technology in Japan.

PY - 2003/9

Y1 - 2003/9

N2 - Thin films of CuIn(S,Se)2 were prepared by thermal crystallization process for photovoltaic device applications and their properties were investigated. From EPMA analysis, S/(S+Se) atomic ratio in the thin films was changed from 0.18 to 1.0 with increasing the S/(S+Se) vapor ratio in the quartz ampoule. X-ray diffraction studies revealed that the thin films had a chalcopyrite CuIn(S,Se)2 structure and the preferred orientation to the 112 plane. The SEM images showed that the grain sizes in CuIn(S,Se)2 thin films decreased with the increase in the S/(S+Se) atomic ratio.

AB - Thin films of CuIn(S,Se)2 were prepared by thermal crystallization process for photovoltaic device applications and their properties were investigated. From EPMA analysis, S/(S+Se) atomic ratio in the thin films was changed from 0.18 to 1.0 with increasing the S/(S+Se) vapor ratio in the quartz ampoule. X-ray diffraction studies revealed that the thin films had a chalcopyrite CuIn(S,Se)2 structure and the preferred orientation to the 112 plane. The SEM images showed that the grain sizes in CuIn(S,Se)2 thin films decreased with the increase in the S/(S+Se) atomic ratio.

KW - C. X-ray diffraction

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