Thin films of CuIn(S,Se)2 were prepared by thermal crystallization process for photovoltaic device applications and their properties were investigated. From EPMA analysis, S/(S+Se) atomic ratio in the thin films was changed from 0.18 to 1.0 with increasing the S/(S+Se) vapor ratio in the quartz ampoule. X-ray diffraction studies revealed that the thin films had a chalcopyrite CuIn(S,Se)2 structure and the preferred orientation to the 112 plane. The SEM images showed that the grain sizes in CuIn(S,Se)2 thin films decreased with the increase in the S/(S+Se) atomic ratio.
|Number of pages||4|
|Journal||Journal of Physics and Chemistry of Solids|
|Publication status||Published - 2003 Sept|
- C. X-ray diffraction
ASJC Scopus subject areas
- Materials Science(all)
- Condensed Matter Physics