@inproceedings{9e726ce9055b4a8e96b97143b8e1cb17,
title = "Principles of perfect and ultrathin anti-reflection with applications to transparent electrode",
abstract = "Anti-reflection(AR), a well-known technique of reducing unwanted reflections by applying an impedance matching layer, works for a specific wavelength and require the coating layer to be a quarter wavelength thick. A broadband operation of AR, however, is not fully understood except for the trial and error method. Here, we present a systematic analytic method of AR without the restriction of wavelength or thickness, i.e. achieving a perfect AR. Specifically, we find analytic permittivity and permeability profiles that remove any given impedance mismatch at the interface between two different dielectrics in a frequency independent way. Ultra-thin AR coating is also shown to be possible and confirmed experimentally with the l/25-wavelength thick AR coating layer made of metamaterials. We apply the concept of ultrathin double layer AR to the transparent conducting electrode, which we demonstrate by fabricating a low reflective dielectric/metal-layered electrode that provides significant electrical conductivity and light transparency.",
keywords = "Anti-reflection, broadband, dispersive permittivity, metamaterial, transparent conducting electrode",
author = "Kim, {Kyoung Ho} and Park, {Q. Han}",
year = "2014",
doi = "10.1117/12.2036070",
language = "English",
isbn = "9780819498977",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
booktitle = "Ultrafast Phenomena and Nanophotonics XVIII",
note = "Ultrafast Phenomena and Nanophotonics XVIII ; Conference date: 02-02-2014 Through 05-02-2014",
}