TY - CHAP
T1 - Probabilistic coverage
AU - Wu, Weili
AU - Zhang, Zhao
AU - Lee, Wonjun
AU - Du, Ding Zhu
N1 - Publisher Copyright:
© Springer Nature Switzerland AG 2020.
PY - 2020
Y1 - 2020
N2 - Previously, we consider that the state of a sensor covering targets is in binary mode: success (cover the targets) or fail (cannot cover the targets). However in the real world, a sensor covers targets with a certain probability, called the Probabilistic coverage, due to various issues which cause the uncertainty and form various probabilistic models, including the probabilistic network model, the probabilistic sensing model, the random noise model, the random fault model, etc. About probabilistic coverage, there is a quite long survey. Here, we introduce this subject briefly. The reader may refer the survey if would like to study more.
AB - Previously, we consider that the state of a sensor covering targets is in binary mode: success (cover the targets) or fail (cannot cover the targets). However in the real world, a sensor covers targets with a certain probability, called the Probabilistic coverage, due to various issues which cause the uncertainty and form various probabilistic models, including the probabilistic network model, the probabilistic sensing model, the random noise model, the random fault model, etc. About probabilistic coverage, there is a quite long survey. Here, we introduce this subject briefly. The reader may refer the survey if would like to study more.
UR - http://www.scopus.com/inward/record.url?scp=85091940867&partnerID=8YFLogxK
U2 - 10.1007/978-3-030-52824-9_13
DO - 10.1007/978-3-030-52824-9_13
M3 - Chapter
AN - SCOPUS:85091940867
T3 - Springer Optimization and Its Applications
SP - 203
EP - 207
BT - Springer Optimization and Its Applications
PB - Springer
ER -