Fingerprint
Dive into the research topics of 'Probabilistic local reconstruction for k-NN regression and its application to virtual metrology in semiconductor manufacturing'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Probabilistic local reconstruction for k-NN regression and its application to virtual metrology in semiconductor manufacturing
Seung kyung Lee, Pilsung Kang, Sungzoon Cho
Research output: Contribution to journal › Article › peer-review
30
Citations
(Scopus)