Probabilistic Monitoring of Correlated Sensors for Nonlinear Processes in State Space

Shunyi Zhao, Yuriy S. Shmaliy, Choon Ki Ahn, Chunhui Zhao

    Research output: Contribution to journalArticlepeer-review

    55 Citations (Scopus)

    Abstract

    To optimize control and/or state estimation of industrial processes, information about measurement quality provided by sensors is required. In this paper, a probabilistic scheme is proposed in discrete-time nonlinear state space with the purpose of sensor monitoring. A quantitative index representing the measurement quality, as well as satisfied state estimates, is obtained by estimating the probability density functions (PDFs) of the states and the measurement noise covariance considered as a random variable using the variational Bayesian approach. To solve the intractable integrals of nonlinear PDFs in real time, a set of weighted particles is generated to overlap an empirical density of state, while the PDF of the measurement noise is still derived analytically. An example of localization and an experiment with a rotary flexible joint are supplied to demonstrate that the proposed algorithm significantly improves the applicability of existing methods and can monitor correlated sensors satisfactorily.

    Original languageEnglish
    Article number8678661
    Pages (from-to)2294-2303
    Number of pages10
    JournalIEEE Transactions on Industrial Electronics
    Volume67
    Issue number3
    DOIs
    Publication statusPublished - 2020 Mar

    Bibliographical note

    Publisher Copyright:
    © 1982-2012 IEEE.

    Keywords

    • Nonlinear process
    • particle approximation
    • sensor monitoring
    • state estimation
    • variational Bayesian (VB) inference

    ASJC Scopus subject areas

    • Control and Systems Engineering
    • Electrical and Electronic Engineering

    Fingerprint

    Dive into the research topics of 'Probabilistic Monitoring of Correlated Sensors for Nonlinear Processes in State Space'. Together they form a unique fingerprint.

    Cite this