Abstract
We present a method to quantitatively measure the thermal conductivity of one-dimensional nanostructures by utilizing scanning thermal wave microscopy (STWM) at a nanoscale spatial resolution. In this paper, we explain the principle for measuring the thermal diffusivity of one-dimensional nanostructures using STWM and the theoretical analysis procedure for quantifying the thermal diffusivity. The SWTM measurement method obtains the thermal conductivity by measuring the thermal diffusivity, which has only a phase lag relative to the distance corresponding to the transferred thermal wave. It is not affected by the thermal contact resistances between the heat source and nanostructure and between the nanostructure and probe. Thus, the heat flux applied to the nanostructure is accurately obtained. The proposed method provides a very simple and quantitative measurement relative to conventional measurement techniques.
Original language | English |
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Pages (from-to) | 957-962 |
Number of pages | 6 |
Journal | Transactions of the Korean Society of Mechanical Engineers, B |
Volume | 38 |
Issue number | 12 |
DOIs | |
Publication status | Published - 2014 |
Keywords
- Nanostructure
- Scanning Thermal Wave Microscopy
- Thermal Conductivity
- Thermal Contact Resistance
ASJC Scopus subject areas
- Mechanical Engineering