TY - GEN
T1 - Quantitative Scanning Thermal microscopy with double scan technique
AU - Kim, Kyeongtae
AU - Jaung, Seungpil
AU - Chung, Jaehoon
AU - Won, Jongbo
AU - Kwon, Ohmyoung
AU - Lee, Joon Sik
AU - Park, Seungho
AU - Choi, Young Ki
N1 - Copyright:
Copyright 2013 Elsevier B.V., All rights reserved.
PY - 2008
Y1 - 2008
N2 - Scanning Thermal Microscope (SThM) is known as a tool of the highest spatial resolution in measuring local temperature and thermophysical properties. However, despite the highest spatial resolution of SThM, its usefulness has been limited because of the difficulties related to the quantitative interpretation of the measured data. We suggest a double scan technique that can make an advantage of heat transfer through the tip-sample contact by subtraction of air conduction signal obtained from 'lift mode' scan. The thermal signal obtained by the new method is free from the influence of air conduction. This, in turn, allowed the quantitative profiling of the sample temperature.
AB - Scanning Thermal Microscope (SThM) is known as a tool of the highest spatial resolution in measuring local temperature and thermophysical properties. However, despite the highest spatial resolution of SThM, its usefulness has been limited because of the difficulties related to the quantitative interpretation of the measured data. We suggest a double scan technique that can make an advantage of heat transfer through the tip-sample contact by subtraction of air conduction signal obtained from 'lift mode' scan. The thermal signal obtained by the new method is free from the influence of air conduction. This, in turn, allowed the quantitative profiling of the sample temperature.
KW - AFM
KW - Nanoscale temperature
KW - SThM (Scanning Thermal Microscope)
KW - Thermoelectric probe
UR - http://www.scopus.com/inward/record.url?scp=49449091596&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=49449091596&partnerID=8YFLogxK
U2 - 10.1115/MNHT2008-52266
DO - 10.1115/MNHT2008-52266
M3 - Conference contribution
AN - SCOPUS:49449091596
SN - 0791842924
SN - 9780791842928
T3 - 2008 Proceedings of the ASME Micro/Nanoscale Heat Transfer International Conference, MNHT 2008
SP - 899
EP - 904
BT - 2008 Proceedings of the ASME Micro/Nanoscale Heat Transfer International Conference, MNHT 2008
T2 - 1st ASME Micro/Nanoscale Heat Transfer International Conference, MNHT08
Y2 - 6 January 2008 through 9 January 2008
ER -