Quantitative Scanning Thermal microscopy with double scan technique

Kyeongtae Kim; Seungpil Jaung; Jaehoon Chung; Jongbo Won; Ohmyoung Kwon; Joon Sik Lee; Seungho Park; Young Ki Choi

doi:10.1115/MNHT2008-52266

Quantitative Scanning Thermal microscopy with double scan technique

Kyeongtae Kim, Seungpil Jaung, Jaehoon Chung, Jongbo Won, Ohmyoung Kwon, Joon Sik Lee, Seungho Park, Young Ki Choi

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

2 Citations (Scopus)

Abstract

Scanning Thermal Microscope (SThM) is known as a tool of the highest spatial resolution in measuring local temperature and thermophysical properties. However, despite the highest spatial resolution of SThM, its usefulness has been limited because of the difficulties related to the quantitative interpretation of the measured data. We suggest a double scan technique that can make an advantage of heat transfer through the tip-sample contact by subtraction of air conduction signal obtained from 'lift mode' scan. The thermal signal obtained by the new method is free from the influence of air conduction. This, in turn, allowed the quantitative profiling of the sample temperature.

Original language	English
Title of host publication	2008 Proceedings of the ASME Micro/Nanoscale Heat Transfer International Conference, MNHT 2008
Pages	899-904
Number of pages	6
DOIs	https://doi.org/10.1115/MNHT2008-52266
Publication status	Published - 2008
Event	1st ASME Micro/Nanoscale Heat Transfer International Conference, MNHT08 - Tainan, Taiwan, Province of China Duration: 2008 Jan 6 → 2008 Jan 9

Publication series

Name	2008 Proceedings of the ASME Micro/Nanoscale Heat Transfer International Conference, MNHT 2008
Volume	PART B

Conference

Conference	1st ASME Micro/Nanoscale Heat Transfer International Conference, MNHT08
Country/Territory	Taiwan, Province of China
City	Tainan
Period	08/1/6 → 08/1/9

Keywords

AFM
Nanoscale temperature
SThM (Scanning Thermal Microscope)
Thermoelectric probe

ASJC Scopus subject areas

Mechanics of Materials
General Materials Science
Condensed Matter Physics
Atomic and Molecular Physics, and Optics

Access to Document

10.1115/MNHT2008-52266

Cite this

Kim, K., Jaung, S., Chung, J., Won, J., Kwon, O., Lee, J. S., Park, S., & Choi, Y. K. (2008). Quantitative Scanning Thermal microscopy with double scan technique. In 2008 Proceedings of the ASME Micro/Nanoscale Heat Transfer International Conference, MNHT 2008 (pp. 899-904). (2008 Proceedings of the ASME Micro/Nanoscale Heat Transfer International Conference, MNHT 2008; Vol. PART B). https://doi.org/10.1115/MNHT2008-52266

Quantitative Scanning Thermal microscopy with double scan technique. / Kim, Kyeongtae; Jaung, Seungpil; Chung, Jaehoon et al.
2008 Proceedings of the ASME Micro/Nanoscale Heat Transfer International Conference, MNHT 2008. 2008. p. 899-904 (2008 Proceedings of the ASME Micro/Nanoscale Heat Transfer International Conference, MNHT 2008; Vol. PART B).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Kim, K, Jaung, S, Chung, J, Won, J, Kwon, O, Lee, JS, Park, S & Choi, YK 2008, Quantitative Scanning Thermal microscopy with double scan technique. in 2008 Proceedings of the ASME Micro/Nanoscale Heat Transfer International Conference, MNHT 2008. 2008 Proceedings of the ASME Micro/Nanoscale Heat Transfer International Conference, MNHT 2008, vol. PART B, pp. 899-904, 1st ASME Micro/Nanoscale Heat Transfer International Conference, MNHT08, Tainan, Taiwan, Province of China, 08/1/6. https://doi.org/10.1115/MNHT2008-52266

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title = "Quantitative Scanning Thermal microscopy with double scan technique",

abstract = "Scanning Thermal Microscope (SThM) is known as a tool of the highest spatial resolution in measuring local temperature and thermophysical properties. However, despite the highest spatial resolution of SThM, its usefulness has been limited because of the difficulties related to the quantitative interpretation of the measured data. We suggest a double scan technique that can make an advantage of heat transfer through the tip-sample contact by subtraction of air conduction signal obtained from 'lift mode' scan. The thermal signal obtained by the new method is free from the influence of air conduction. This, in turn, allowed the quantitative profiling of the sample temperature.",

keywords = "AFM, Nanoscale temperature, SThM (Scanning Thermal Microscope), Thermoelectric probe",

author = "Kyeongtae Kim and Seungpil Jaung and Jaehoon Chung and Jongbo Won and Ohmyoung Kwon and Lee, {Joon Sik} and Seungho Park and Choi, {Young Ki}",

year = "2008",

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AU - Lee, Joon Sik

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AB - Scanning Thermal Microscope (SThM) is known as a tool of the highest spatial resolution in measuring local temperature and thermophysical properties. However, despite the highest spatial resolution of SThM, its usefulness has been limited because of the difficulties related to the quantitative interpretation of the measured data. We suggest a double scan technique that can make an advantage of heat transfer through the tip-sample contact by subtraction of air conduction signal obtained from 'lift mode' scan. The thermal signal obtained by the new method is free from the influence of air conduction. This, in turn, allowed the quantitative profiling of the sample temperature.

KW - AFM

KW - Nanoscale temperature

KW - SThM (Scanning Thermal Microscope)

KW - Thermoelectric probe

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Quantitative Scanning Thermal microscopy with double scan technique

Abstract

Publication series

Conference

Keywords

ASJC Scopus subject areas

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