Quantitative Scanning Thermal microscopy with double scan technique

Kyeongtae Kim; Seungpil Jaung; Jaehoon Chung; Jongbo Won; Ohmyoung Kwon; Joon Sik Lee; Seungho Park; Young Ki Choi

doi:10.1115/MNHT2008-52266

Quantitative Scanning Thermal microscopy with double scan technique

Kyeongtae Kim, Seungpil Jaung, Jaehoon Chung, Jongbo Won, Ohmyoung Kwon, Joon Sik Lee, Seungho Park, Young Ki Choi

School of Mechanical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

2 Citations (Scopus)

Abstract

Scanning Thermal Microscope (SThM) is known as a tool of the highest spatial resolution in measuring local temperature and thermophysical properties. However, despite the highest spatial resolution of SThM, its usefulness has been limited because of the difficulties related to the quantitative interpretation of the measured data. We suggest a double scan technique that can make an advantage of heat transfer through the tip-sample contact by subtraction of air conduction signal obtained from 'lift mode' scan. The thermal signal obtained by the new method is free from the influence of air conduction. This, in turn, allowed the quantitative profiling of the sample temperature.

Original language	English
Title of host publication	2008 Proceedings of the ASME Micro/Nanoscale Heat Transfer International Conference, MNHT 2008
Pages	899-904
Number of pages	6
DOIs	https://doi.org/10.1115/MNHT2008-52266
Publication status	Published - 2008
Event	1st ASME Micro/Nanoscale Heat Transfer International Conference, MNHT08 - Tainan, Taiwan, Province of China Duration: 2008 Jan 6 → 2008 Jan 9

Publication series

Name	2008 Proceedings of the ASME Micro/Nanoscale Heat Transfer International Conference, MNHT 2008
Volume	PART B

Conference

Conference	1st ASME Micro/Nanoscale Heat Transfer International Conference, MNHT08
Country/Territory	Taiwan, Province of China
City	Tainan
Period	08/1/6 → 08/1/9

Keywords

AFM
Nanoscale temperature
SThM (Scanning Thermal Microscope)
Thermoelectric probe

ASJC Scopus subject areas

Mechanics of Materials
Materials Science(all)
Condensed Matter Physics
Atomic and Molecular Physics, and Optics

Access to Document

10.1115/MNHT2008-52266

Cite this

Kim, K., Jaung, S., Chung, J., Won, J., Kwon, O., Lee, J. S., Park, S., & Choi, Y. K. (2008). Quantitative Scanning Thermal microscopy with double scan technique. In 2008 Proceedings of the ASME Micro/Nanoscale Heat Transfer International Conference, MNHT 2008 (pp. 899-904). (2008 Proceedings of the ASME Micro/Nanoscale Heat Transfer International Conference, MNHT 2008; Vol. PART B). https://doi.org/10.1115/MNHT2008-52266

Quantitative Scanning Thermal microscopy with double scan technique. / Kim, Kyeongtae; Jaung, Seungpil; Chung, Jaehoon et al.
2008 Proceedings of the ASME Micro/Nanoscale Heat Transfer International Conference, MNHT 2008. 2008. p. 899-904 (2008 Proceedings of the ASME Micro/Nanoscale Heat Transfer International Conference, MNHT 2008; Vol. PART B).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Kim, K, Jaung, S, Chung, J, Won, J, Kwon, O, Lee, JS, Park, S & Choi, YK 2008, Quantitative Scanning Thermal microscopy with double scan technique. in 2008 Proceedings of the ASME Micro/Nanoscale Heat Transfer International Conference, MNHT 2008. 2008 Proceedings of the ASME Micro/Nanoscale Heat Transfer International Conference, MNHT 2008, vol. PART B, pp. 899-904, 1st ASME Micro/Nanoscale Heat Transfer International Conference, MNHT08, Tainan, Taiwan, Province of China, 08/1/6. https://doi.org/10.1115/MNHT2008-52266

@inproceedings{a6af70e16fa4428bb65bb353c8d4638a,

title = "Quantitative Scanning Thermal microscopy with double scan technique",

abstract = "Scanning Thermal Microscope (SThM) is known as a tool of the highest spatial resolution in measuring local temperature and thermophysical properties. However, despite the highest spatial resolution of SThM, its usefulness has been limited because of the difficulties related to the quantitative interpretation of the measured data. We suggest a double scan technique that can make an advantage of heat transfer through the tip-sample contact by subtraction of air conduction signal obtained from 'lift mode' scan. The thermal signal obtained by the new method is free from the influence of air conduction. This, in turn, allowed the quantitative profiling of the sample temperature.",

keywords = "AFM, Nanoscale temperature, SThM (Scanning Thermal Microscope), Thermoelectric probe",

author = "Kyeongtae Kim and Seungpil Jaung and Jaehoon Chung and Jongbo Won and Ohmyoung Kwon and Lee, {Joon Sik} and Seungho Park and Choi, {Young Ki}",

year = "2008",

doi = "10.1115/MNHT2008-52266",

language = "English",

isbn = "0791842924",

series = "2008 Proceedings of the ASME Micro/Nanoscale Heat Transfer International Conference, MNHT 2008",

pages = "899--904",

booktitle = "2008 Proceedings of the ASME Micro/Nanoscale Heat Transfer International Conference, MNHT 2008",

}

TY - GEN

T1 - Quantitative Scanning Thermal microscopy with double scan technique

AU - Kim, Kyeongtae

AU - Jaung, Seungpil

AU - Chung, Jaehoon

AU - Won, Jongbo

AU - Kwon, Ohmyoung

AU - Lee, Joon Sik

AU - Park, Seungho

AU - Choi, Young Ki

PY - 2008

Y1 - 2008

N2 - Scanning Thermal Microscope (SThM) is known as a tool of the highest spatial resolution in measuring local temperature and thermophysical properties. However, despite the highest spatial resolution of SThM, its usefulness has been limited because of the difficulties related to the quantitative interpretation of the measured data. We suggest a double scan technique that can make an advantage of heat transfer through the tip-sample contact by subtraction of air conduction signal obtained from 'lift mode' scan. The thermal signal obtained by the new method is free from the influence of air conduction. This, in turn, allowed the quantitative profiling of the sample temperature.

AB - Scanning Thermal Microscope (SThM) is known as a tool of the highest spatial resolution in measuring local temperature and thermophysical properties. However, despite the highest spatial resolution of SThM, its usefulness has been limited because of the difficulties related to the quantitative interpretation of the measured data. We suggest a double scan technique that can make an advantage of heat transfer through the tip-sample contact by subtraction of air conduction signal obtained from 'lift mode' scan. The thermal signal obtained by the new method is free from the influence of air conduction. This, in turn, allowed the quantitative profiling of the sample temperature.

KW - AFM

KW - Nanoscale temperature

KW - SThM (Scanning Thermal Microscope)

KW - Thermoelectric probe

UR - http://www.scopus.com/inward/record.url?scp=49449091596&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=49449091596&partnerID=8YFLogxK

U2 - 10.1115/MNHT2008-52266

DO - 10.1115/MNHT2008-52266

M3 - Conference contribution

AN - SCOPUS:49449091596

SN - 0791842924

SN - 9780791842928

T3 - 2008 Proceedings of the ASME Micro/Nanoscale Heat Transfer International Conference, MNHT 2008

SP - 899

EP - 904

BT - 2008 Proceedings of the ASME Micro/Nanoscale Heat Transfer International Conference, MNHT 2008

T2 - 1st ASME Micro/Nanoscale Heat Transfer International Conference, MNHT08

Y2 - 6 January 2008 through 9 January 2008

ER -

Quantitative Scanning Thermal microscopy with double scan technique

Abstract

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Conference

Keywords

ASJC Scopus subject areas

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