Quantitative temperature mapping of carbon nanotube using null point method

Jaehun Chung; Kyeongtae Kim; Kwangseok Hwang; Ohmyoung Kwon; Young Ki Choi; Seungwon Jung; Jungnoon Lee

doi:10.1109/NANO.2010.5697812

Quantitative temperature mapping of carbon nanotube using null point method

Jaehun Chung, Kyeongtae Kim, Kwangseok Hwang, Ohmyoung Kwon, Young Ki Choi, Seungwon Jung, Jungnoon Lee

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Despite the high spatial resolution of scanning thermal microscope, its usefulness has been limited because of its lack of quantitative measurement. In this study, utilizing the principle of double scan technique, we developed the null-point method by which one can measure the temperature of a nanoscale sample quantitatively without the disturbances due to the heat transfer through the air and the variation of tip-sample conductance caused by the change of tip-sample contact area. We first checked the effectiveness and accuracy of null point method using 5 μm and 400 nm wide aluminium line whose temperature can be easily controlled and measured. Then, we measured the temperature of electrically heated multi-walled carbon nanotube (MWCNT) via null point method and the temperature profile around it using double scan technique.

Original language	English
Title of host publication	2010 10th IEEE Conference on Nanotechnology, NANO 2010
Pages	722-726
Number of pages	5
DOIs	https://doi.org/10.1109/NANO.2010.5697812
Publication status	Published - 2010
Event	2010 10th IEEE Conference on Nanotechnology, NANO 2010 - Ilsan, Gyeonggi-Do, Korea, Republic of Duration: 2010 Aug 17 → 2010 Aug 20

Publication series

Name	2010 10th IEEE Conference on Nanotechnology, NANO 2010

Other

Other	2010 10th IEEE Conference on Nanotechnology, NANO 2010
Country/Territory	Korea, Republic of
City	Ilsan, Gyeonggi-Do
Period	10/8/17 → 10/8/20

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics

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10.1109/NANO.2010.5697812

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Chung, J, Kim, K, Hwang, K, Kwon, O, Choi, YK, Jung, S & Lee, J 2010, Quantitative temperature mapping of carbon nanotube using null point method. in 2010 10th IEEE Conference on Nanotechnology, NANO 2010., 5697812, 2010 10th IEEE Conference on Nanotechnology, NANO 2010, pp. 722-726, 2010 10th IEEE Conference on Nanotechnology, NANO 2010, Ilsan, Gyeonggi-Do, Korea, Republic of, 10/8/17. https://doi.org/10.1109/NANO.2010.5697812

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title = "Quantitative temperature mapping of carbon nanotube using null point method",

abstract = "Despite the high spatial resolution of scanning thermal microscope, its usefulness has been limited because of its lack of quantitative measurement. In this study, utilizing the principle of double scan technique, we developed the null-point method by which one can measure the temperature of a nanoscale sample quantitatively without the disturbances due to the heat transfer through the air and the variation of tip-sample conductance caused by the change of tip-sample contact area. We first checked the effectiveness and accuracy of null point method using 5 μm and 400 nm wide aluminium line whose temperature can be easily controlled and measured. Then, we measured the temperature of electrically heated multi-walled carbon nanotube (MWCNT) via null point method and the temperature profile around it using double scan technique.",

author = "Jaehun Chung and Kyeongtae Kim and Kwangseok Hwang and Ohmyoung Kwon and Choi, {Young Ki} and Seungwon Jung and Jungnoon Lee",

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doi = "10.1109/NANO.2010.5697812",

language = "English",

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AU - Chung, Jaehun

AU - Kim, Kyeongtae

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AU - Choi, Young Ki

AU - Jung, Seungwon

AU - Lee, Jungnoon

PY - 2010

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N2 - Despite the high spatial resolution of scanning thermal microscope, its usefulness has been limited because of its lack of quantitative measurement. In this study, utilizing the principle of double scan technique, we developed the null-point method by which one can measure the temperature of a nanoscale sample quantitatively without the disturbances due to the heat transfer through the air and the variation of tip-sample conductance caused by the change of tip-sample contact area. We first checked the effectiveness and accuracy of null point method using 5 μm and 400 nm wide aluminium line whose temperature can be easily controlled and measured. Then, we measured the temperature of electrically heated multi-walled carbon nanotube (MWCNT) via null point method and the temperature profile around it using double scan technique.

AB - Despite the high spatial resolution of scanning thermal microscope, its usefulness has been limited because of its lack of quantitative measurement. In this study, utilizing the principle of double scan technique, we developed the null-point method by which one can measure the temperature of a nanoscale sample quantitatively without the disturbances due to the heat transfer through the air and the variation of tip-sample conductance caused by the change of tip-sample contact area. We first checked the effectiveness and accuracy of null point method using 5 μm and 400 nm wide aluminium line whose temperature can be easily controlled and measured. Then, we measured the temperature of electrically heated multi-walled carbon nanotube (MWCNT) via null point method and the temperature profile around it using double scan technique.

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T3 - 2010 10th IEEE Conference on Nanotechnology, NANO 2010

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ER -

Quantitative temperature mapping of carbon nanotube using null point method

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