Quantitative temperature profiling through null-point scanning thermal microscopy

J. Chung; K. Kim; G. Hwang; O. Kwon; Y. K. Choi; J. S. Lee

doi:10.1016/j.ijthermalsci.2011.11.012

Quantitative temperature profiling through null-point scanning thermal microscopy

J. Chung, K. Kim, G. Hwang, O. Kwon, Y. K. Choi, J. S. Lee

Research output: Contribution to journal › Article › peer-review

34 Citations (Scopus)

Abstract

We develop and demonstrate the theory and method of null-point scanning thermal microscopy, which can obtain quantitative temperature profiles even when the heat conductance between the tip and the sample is disturbed due to abrupt changes in the surface topography or properties. Due to its generality, it would be widely applicable for a variety of problems associated with the thermal characterization of nanomaterials and nanodevices.

Original language	English
Pages (from-to)	109-113
Number of pages	5
Journal	International Journal of Thermal Sciences
Volume	62
DOIs	https://doi.org/10.1016/j.ijthermalsci.2011.11.012
Publication status	Published - 2012 Dec

Bibliographical note

Funding Information:
This work was supported by a National Research Foundation of Korea Grant ( 2010–0014522 ) funded by the Korean government. The authors thank the Inter-university Semiconductor Research Center (ISRC) at Seoul National University for their support.

Keywords

Nanoscale thermal measurement
Null-point method
Quantitative temperature profiling
Scanning thermal microscopy (SThM)
Thermal conductance
Thermometry

ASJC Scopus subject areas

Condensed Matter Physics
General Engineering

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10.1016/j.ijthermalsci.2011.11.012

Cite this

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title = "Quantitative temperature profiling through null-point scanning thermal microscopy",

abstract = "We develop and demonstrate the theory and method of null-point scanning thermal microscopy, which can obtain quantitative temperature profiles even when the heat conductance between the tip and the sample is disturbed due to abrupt changes in the surface topography or properties. Due to its generality, it would be widely applicable for a variety of problems associated with the thermal characterization of nanomaterials and nanodevices.",

keywords = "Nanoscale thermal measurement, Null-point method, Quantitative temperature profiling, Scanning thermal microscopy (SThM), Thermal conductance, Thermometry",

author = "J. Chung and K. Kim and G. Hwang and O. Kwon and Choi, {Y. K.} and Lee, {J. S.}",

note = "Funding Information: This work was supported by a National Research Foundation of Korea Grant ( 2010–0014522 ) funded by the Korean government. The authors thank the Inter-university Semiconductor Research Center (ISRC) at Seoul National University for their support. ",

year = "2012",

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doi = "10.1016/j.ijthermalsci.2011.11.012",

language = "English",

volume = "62",

pages = "109--113",

journal = "International Journal of Thermal Sciences",

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T1 - Quantitative temperature profiling through null-point scanning thermal microscopy

AU - Chung, J.

AU - Kim, K.

AU - Hwang, G.

AU - Kwon, O.

AU - Choi, Y. K.

AU - Lee, J. S.

N1 - Funding Information: This work was supported by a National Research Foundation of Korea Grant ( 2010–0014522 ) funded by the Korean government. The authors thank the Inter-university Semiconductor Research Center (ISRC) at Seoul National University for their support.

PY - 2012/12

Y1 - 2012/12

N2 - We develop and demonstrate the theory and method of null-point scanning thermal microscopy, which can obtain quantitative temperature profiles even when the heat conductance between the tip and the sample is disturbed due to abrupt changes in the surface topography or properties. Due to its generality, it would be widely applicable for a variety of problems associated with the thermal characterization of nanomaterials and nanodevices.

AB - We develop and demonstrate the theory and method of null-point scanning thermal microscopy, which can obtain quantitative temperature profiles even when the heat conductance between the tip and the sample is disturbed due to abrupt changes in the surface topography or properties. Due to its generality, it would be widely applicable for a variety of problems associated with the thermal characterization of nanomaterials and nanodevices.

KW - Nanoscale thermal measurement

KW - Null-point method

KW - Quantitative temperature profiling

KW - Scanning thermal microscopy (SThM)

KW - Thermal conductance

KW - Thermometry

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DO - 10.1016/j.ijthermalsci.2011.11.012

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SN - 1290-0729

VL - 62

SP - 109

EP - 113

JO - International Journal of Thermal Sciences

JF - International Journal of Thermal Sciences

ER -

Quantitative temperature profiling through null-point scanning thermal microscopy

Abstract

Bibliographical note

Keywords

ASJC Scopus subject areas

Access to Document

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