Quantitative temperature profiling through null-point scanning thermal microscopy

J. Chung, K. Kim, G. Hwang, O. Kwon, Y. K. Choi, J. S. Lee

Research output: Contribution to journalArticlepeer-review

34 Citations (Scopus)

Abstract

We develop and demonstrate the theory and method of null-point scanning thermal microscopy, which can obtain quantitative temperature profiles even when the heat conductance between the tip and the sample is disturbed due to abrupt changes in the surface topography or properties. Due to its generality, it would be widely applicable for a variety of problems associated with the thermal characterization of nanomaterials and nanodevices.

Original languageEnglish
Pages (from-to)109-113
Number of pages5
JournalInternational Journal of Thermal Sciences
Volume62
DOIs
Publication statusPublished - 2012 Dec

Bibliographical note

Funding Information:
This work was supported by a National Research Foundation of Korea Grant ( 2010–0014522 ) funded by the Korean government. The authors thank the Inter-university Semiconductor Research Center (ISRC) at Seoul National University for their support.

Keywords

  • Nanoscale thermal measurement
  • Null-point method
  • Quantitative temperature profiling
  • Scanning thermal microscopy (SThM)
  • Thermal conductance
  • Thermometry

ASJC Scopus subject areas

  • Condensed Matter Physics
  • General Engineering

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