Quantitative thermopower profiling across a silicon p-n junction with nanometer resolution

Byeonghee Lee, Kyeongtae Kim, Seungkoo Lee, Jong Hoon Kim, Dae Soon Lim, Ohmyoung Kwon, Joon Sik Lee

Research output: Contribution to journalArticlepeer-review

12 Citations (Scopus)

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Engineering & Materials Science

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