Radiation damage in GaN-based materials and devices

Erin Patrick, Mark E. Law, S. J. Pearton, Richard Deist, Fan Ren, Lu Liu, A. Y. Polyakov, Jihyun Kim

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    3 Citations (Scopus)

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    Keyphrases

    Engineering

    Material Science

    Physics