Abstract
The effects of 30 keV proton irradiation on n+/p AlInGaP solar cells are presented here. As the proton fluence increases to more than 1 × 1010 cm-2, the maximum power Pmax of the cell decreases markedly due to the introduction of defects by proton irradiation. From the changes in minority-carrier diffusion length determined by quantum efficiency modeling as a function of fluence, the damage constant KL for p-AlInGaP was estimated to be about 5.0 × 10-5. This value is comparable to that observed from 3 MeV proton-irradiated p-InGaP whereas it is lower than that observed from 3 MeV proton-irradiated p-InGaAsP and p-InGaAs cells. The maximum power recovery of the cell was observed by minority-carrier-injection-enhanced annealing (1 A/cm2), and the annealing activation energy for 30 keV proton-irradiation-induced defects in p-AlInGaP was determined as ΔE = 0.42 eV.
Original language | English |
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Pages (from-to) | L645-L647 |
Journal | Japanese Journal of Applied Physics, Part 2: Letters |
Volume | 46 |
Issue number | 25-28 |
DOIs | |
Publication status | Published - 2007 Jul 13 |
Externally published | Yes |
Keywords
- AlInGaP
- Damage constant
- Irradiation-induced defects
- Proton irradiation
- Solar cells
ASJC Scopus subject areas
- General Engineering
- General Physics and Astronomy