Rapid Run-Time DRAM PUF Based on Bit-Flip Position for Secure IoT Devices

Indra Kumari; Mi Kyung Oh; Yousung Kang; Dooho Choi

doi:10.1109/ICSENS.2018.8589608

Rapid Run-Time DRAM PUF Based on Bit-Flip Position for Secure IoT Devices

Indra Kumari
, Mi Kyung Oh
, Yousung Kang
, Dooho Choi

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

8 Citations (Scopus)

Abstract

IoT services are expanding beyond basic sensor networks to various services such as connected cars, smart factories, and smart cities. As a result, security issues are also growing rapidly, especially for low-cost IoT devices. One of good security solutions is to use the Physical Unclonable Function (PUF) technology to uniquely identify hardware components. In this paper, we propose a new approach to reduce the latency of the decay based DRAM PUF at run-time in commodity IoT devices. Experimental results based on Intel Galileo Gen2 Boards show that our methods can quickly generate the PUF values with good uniqueness and uniformity within 15 seconds.

Original language	English
Title of host publication	2018 IEEE SENSORS, SENSORS 2018 - Conference Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781538647073
DOIs	https://doi.org/10.1109/ICSENS.2018.8589608
Publication status	Published - 2018 Dec 26
Externally published	Yes
Event	17th IEEE SENSORS Conference, SENSORS 2018 - New Delhi, India Duration: 2018 Oct 28 → 2018 Oct 31

Publication series

Name	Proceedings of IEEE Sensors
Volume	2018-October
ISSN (Print)	1930-0395
ISSN (Electronic)	2168-9229

Conference

Conference	17th IEEE SENSORS Conference, SENSORS 2018
Country/Territory	India
City	New Delhi
Period	18/10/28 → 18/10/31

Bibliographical note

Publisher Copyright:
© 2018 IEEE.

Keywords

DRAM PUFs
loT Security
Physical Unclonable Function
Run-time

ASJC Scopus subject areas

Electrical and Electronic Engineering

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

Access to Document

10.1109/ICSENS.2018.8589608

Cite this

Rapid Run-Time DRAM PUF Based on Bit-Flip Position for Secure IoT Devices. / Kumari, Indra; Oh, Mi Kyung; Kang, Yousung et al.
2018 IEEE SENSORS, SENSORS 2018 - Conference Proceedings. Institute of Electrical and Electronics Engineers Inc., 2018. 8589608 (Proceedings of IEEE Sensors; Vol. 2018-October).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Kumari, I, Oh, MK, Kang, Y & Choi, D 2018, Rapid Run-Time DRAM PUF Based on Bit-Flip Position for Secure IoT Devices. in 2018 IEEE SENSORS, SENSORS 2018 - Conference Proceedings., 8589608, Proceedings of IEEE Sensors, vol. 2018-October, Institute of Electrical and Electronics Engineers Inc., 17th IEEE SENSORS Conference, SENSORS 2018, New Delhi, India, 18/10/28. https://doi.org/10.1109/ICSENS.2018.8589608

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M3 - Conference contribution

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ER -

Rapid Run-Time DRAM PUF Based on Bit-Flip Position for Secure IoT Devices

Abstract

Publication series

Conference

Bibliographical note

Keywords

ASJC Scopus subject areas

UN SDGs

Access to Document

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