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Reconfigurable ECC for adaptive protection of memory
Abhishek Basak
, Somnath Paul
, Jangwon Park
,
Jongsun Park
, Swarup Bhunia
Research output
:
Chapter in Book/Report/Conference proceeding
›
Conference contribution
13
Citations (Scopus)
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Keyphrases
Reconfigurable
100%
Error Correction Codes
100%
Adaptive Protection
100%
Memory Block
60%
Redundancy
40%
Runtime Failures
40%
Diverse Applications
20%
Error Resilience
20%
Design Challenges
20%
Manufacturing Process
20%
Healing
20%
Memory Array
20%
Induced Failures
20%
Intrinsic Reliability
20%
Process Variation
20%
Runt
20%
Nanoscale Memory
20%
Post-silicon
20%
Spatial Shift
20%
Row-column
20%
Manufacturing Defects
20%
Temporal Shift
20%
Protection Level
20%
Healing Techniques
20%
Low-power Memory
20%
Timing Error
20%
Large Memory
20%
Increasing Runs
20%
Low-voltage Low-power
20%
Computer Science
Error Correction Code
100%
Design Challenge
20%
Column Redundancy
20%
Manufacturing Defect
20%
Memory Array
20%
Process Variation
20%
Protection Level
20%