Abstract
Characterization of devices operating under large signal conditions at nonlinear regions requires specific measurement setups since the output power value, operation efficiency, power gain, and linearity are functions of the source impedance, input signal level, biasing values, and load impedance. Hence, measuring a device's parameters while varying the source or load impedance (called source-pull and load-pull, respectively) is essential to evaluate its nonlinear behaviors.
| Original language | English |
|---|---|
| Pages (from-to) | 72-79 |
| Number of pages | 8 |
| Journal | IEEE Microwave Magazine |
| Volume | 25 |
| Issue number | 6 |
| DOIs | |
| Publication status | Published - 2024 Jun 1 |
Bibliographical note
Publisher Copyright:© 2000-2012 IEEE.
ASJC Scopus subject areas
- Radiation
- Condensed Matter Physics
- Electrical and Electronic Engineering
Fingerprint
Dive into the research topics of 'Reflectionless High-Pass Filters for Load-Pull Setups: Reflectionless High-Pass Filters Improve Load Pull Measurement Stability'. Together they form a unique fingerprint.Cite this
- APA
- Standard
- Harvard
- Vancouver
- Author
- BIBTEX
- RIS