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Reliability characteristics of 200 GHz fT/285 GHz fMAX SiGe HBTs

  • Greg Freeman*
  • , Zhijian Yang
  • , Fernando Guarin
  • , Jae Sung Rieh
  • , David Ahlgren
  • , Ed Hostetter
    • *Corresponding author for this work

Research output: Contribution to conference › Paper › peer-review

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