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Reliability of high-speed SiGe heterojunction bipolar transistors under very high forward current density
Jae Sung Rieh, Kimball M. Watson, Fernando Guarin, Zhijian Yang, Ping Chuan Wang, Alvin J. Joseph, Greg Freeman, Seshadri Subbanna
Research output: Contribution to journal › Article › peer-review
40
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(Scopus)