Reliability of microwave SiGe/Si heterojunction bipolar transistors

Keyphrases

• Heterojunction Bipolar Transistors 100%
• Si Heterojunction 100%
• Parasitic Energy 50%
• Impurity Diffusion 50%
• Different Ambient Temperatures 50%
• Boron Atom 50%
• DC Current Gain 50%
• Accelerated Lifetime Testing 50%
• Microwave Performance 50%
• Base Region 50%
• Solid Source Molecular Beam Epitaxy 50%

Engineering

• Collector Junction 50%
• Current Gain 50%
• Base Region 50%
• Energy Barrier 50%

Material Science

• Bipolar Transistor 100%