Reliability performance for InGaAsP/InP laser diodes mounted on different sizes of heat blocks in to packages

Hyun Jae Yoon; Nack Jin Chung; Min Ho Choi; In Shik Park; Jichai Jeong

doi:10.1016/S0038-1101(98)00188-9

Reliability performance for InGaAsP/InP laser diodes mounted on different sizes of heat blocks in to packages

Hyun Jae Yoon, Nack Jin Chung, Min Ho Choi, In Shik Park, Jichai Jeong

Research output: Contribution to journal › Article › peer-review

5 Citations (Scopus)

Abstract

We have estimated the lifetime of InGaAsP/InP laser diodes mounted on different heat block sizes. From an accelerated aging test of laser diodes mounted on the different sizes of heat blocks in TO cans, we have found the difference in the reliability performance. The median normalized degradation ratios (NDRs) of large block (1.4 mm × 1.7 mm²) samples are 1.22%/kh and 0.26%/kh at 40°C for laser diodes from A and B wafers, respectively. For the small block (1.3 mm × 0.9 mm²) samples, the median NDRs are 1.44%/kh and 0.48%/kh for laser diodes from A and B wafers. The reliability performance is better for lasers mounted on the large block samples. The difference in reliability performance due to the heat block size can be explained by developing the heat transfer model. The surface size of heat blocks is the important parameter to retard the degradation process due to the junction temperature difference and then improve reliability performance.

Original language	English
Pages (from-to)	1969-1974
Number of pages	6
Journal	Solid-State Electronics
Volume	42
Issue number	11
DOIs	https://doi.org/10.1016/S0038-1101(98)00188-9
Publication status	Published - 1998 Nov

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Electrical and Electronic Engineering
Materials Chemistry

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title = "Reliability performance for InGaAsP/InP laser diodes mounted on different sizes of heat blocks in to packages",

abstract = "We have estimated the lifetime of InGaAsP/InP laser diodes mounted on different heat block sizes. From an accelerated aging test of laser diodes mounted on the different sizes of heat blocks in TO cans, we have found the difference in the reliability performance. The median normalized degradation ratios (NDRs) of large block (1.4 mm × 1.7 mm2) samples are 1.22%/kh and 0.26%/kh at 40°C for laser diodes from A and B wafers, respectively. For the small block (1.3 mm × 0.9 mm2) samples, the median NDRs are 1.44%/kh and 0.48%/kh for laser diodes from A and B wafers. The reliability performance is better for lasers mounted on the large block samples. The difference in reliability performance due to the heat block size can be explained by developing the heat transfer model. The surface size of heat blocks is the important parameter to retard the degradation process due to the junction temperature difference and then improve reliability performance.",

author = "Yoon, {Hyun Jae} and Chung, {Nack Jin} and Choi, {Min Ho} and Park, {In Shik} and Jichai Jeong",

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AU - Yoon, Hyun Jae

AU - Chung, Nack Jin

AU - Choi, Min Ho

AU - Park, In Shik

AU - Jeong, Jichai

PY - 1998/11

Y1 - 1998/11

N2 - We have estimated the lifetime of InGaAsP/InP laser diodes mounted on different heat block sizes. From an accelerated aging test of laser diodes mounted on the different sizes of heat blocks in TO cans, we have found the difference in the reliability performance. The median normalized degradation ratios (NDRs) of large block (1.4 mm × 1.7 mm2) samples are 1.22%/kh and 0.26%/kh at 40°C for laser diodes from A and B wafers, respectively. For the small block (1.3 mm × 0.9 mm2) samples, the median NDRs are 1.44%/kh and 0.48%/kh for laser diodes from A and B wafers. The reliability performance is better for lasers mounted on the large block samples. The difference in reliability performance due to the heat block size can be explained by developing the heat transfer model. The surface size of heat blocks is the important parameter to retard the degradation process due to the junction temperature difference and then improve reliability performance.

AB - We have estimated the lifetime of InGaAsP/InP laser diodes mounted on different heat block sizes. From an accelerated aging test of laser diodes mounted on the different sizes of heat blocks in TO cans, we have found the difference in the reliability performance. The median normalized degradation ratios (NDRs) of large block (1.4 mm × 1.7 mm2) samples are 1.22%/kh and 0.26%/kh at 40°C for laser diodes from A and B wafers, respectively. For the small block (1.3 mm × 0.9 mm2) samples, the median NDRs are 1.44%/kh and 0.48%/kh for laser diodes from A and B wafers. The reliability performance is better for lasers mounted on the large block samples. The difference in reliability performance due to the heat block size can be explained by developing the heat transfer model. The surface size of heat blocks is the important parameter to retard the degradation process due to the junction temperature difference and then improve reliability performance.

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Reliability performance for InGaAsP/InP laser diodes mounted on different sizes of heat blocks in to packages

Abstract

ASJC Scopus subject areas

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