Residual modulation reduction in optical sectioning using a suitable spatial light modulator waveform

Jeong Heon Han; Nak Won Yoo; Myung Ha Kim; Byeong Kwon Ju; Min Chul Park

doi:10.1364/AO.58.005883

Residual modulation reduction in optical sectioning using a suitable spatial light modulator waveform

Jeong Heon Han, Nak Won Yoo, Myung Ha Kim, Byeong Kwon Ju, Min Chul Park

School of Electrical Engineering

Research output: Contribution to journal › Article › peer-review

Abstract

We propose a method to improve the axial response of structured illumination microscopy via selection of an illumination pattern with a sinusoidal or square wave within the cutoff frequency of the imaging system. Residual modulation within a sectioned image is mitigated by accurate phase-shifting via the electrical spatial light modulator control signal, which is based on an illumination pattern having a suitable waveform. Reduction in residual modulation is observed in the sinusoidal pattern with a spatial frequency sufficiently below the cutoff frequency of the imaging system. This reduction is larger for the square wave as the spatial frequency approaches one-third of the cutoff frequency.

Original language	English
Pages (from-to)	5883-5891
Number of pages	9
Journal	Applied optics
Volume	58
Issue number	22
DOIs	https://doi.org/10.1364/AO.58.005883
Publication status	Published - 2019

Bibliographical note

Funding Information:
Korea Creative Content Agency (KOCCA) (R2017060005).

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics
Engineering (miscellaneous)
Electrical and Electronic Engineering

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10.1364/AO.58.005883

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title = "Residual modulation reduction in optical sectioning using a suitable spatial light modulator waveform",

abstract = "We propose a method to improve the axial response of structured illumination microscopy via selection of an illumination pattern with a sinusoidal or square wave within the cutoff frequency of the imaging system. Residual modulation within a sectioned image is mitigated by accurate phase-shifting via the electrical spatial light modulator control signal, which is based on an illumination pattern having a suitable waveform. Reduction in residual modulation is observed in the sinusoidal pattern with a spatial frequency sufficiently below the cutoff frequency of the imaging system. This reduction is larger for the square wave as the spatial frequency approaches one-third of the cutoff frequency.",

author = "Han, {Jeong Heon} and Yoo, {Nak Won} and Kim, {Myung Ha} and Ju, {Byeong Kwon} and Park, {Min Chul}",

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AU - Yoo, Nak Won

AU - Kim, Myung Ha

AU - Ju, Byeong Kwon

AU - Park, Min Chul

N1 - Funding Information: Korea Creative Content Agency (KOCCA) (R2017060005).

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AB - We propose a method to improve the axial response of structured illumination microscopy via selection of an illumination pattern with a sinusoidal or square wave within the cutoff frequency of the imaging system. Residual modulation within a sectioned image is mitigated by accurate phase-shifting via the electrical spatial light modulator control signal, which is based on an illumination pattern having a suitable waveform. Reduction in residual modulation is observed in the sinusoidal pattern with a spatial frequency sufficiently below the cutoff frequency of the imaging system. This reduction is larger for the square wave as the spatial frequency approaches one-third of the cutoff frequency.

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Residual modulation reduction in optical sectioning using a suitable spatial light modulator waveform

Abstract

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ASJC Scopus subject areas

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