Residual modulation reduction in optical sectioning using a suitable spatial light modulator waveform

Jeong Heon Han; Nak Won Yoo; Myung Ha Kim; Byeong Kwon Ju; Min Chul Park

doi:10.1364/AO.58.005883

Residual modulation reduction in optical sectioning using a suitable spatial light modulator waveform

Jeong Heon Han, Nak Won Yoo, Myung Ha Kim, Byeong Kwon Ju, Min Chul Park

Research output: Contribution to journal › Article › peer-review

Abstract

We propose a method to improve the axial response of structured illumination microscopy via selection of an illumination pattern with a sinusoidal or square wave within the cutoff frequency of the imaging system. Residual modulation within a sectioned image is mitigated by accurate phase-shifting via the electrical spatial light modulator control signal, which is based on an illumination pattern having a suitable waveform. Reduction in residual modulation is observed in the sinusoidal pattern with a spatial frequency sufficiently below the cutoff frequency of the imaging system. This reduction is larger for the square wave as the spatial frequency approaches one-third of the cutoff frequency.

Original language	English
Pages (from-to)	5883-5891
Number of pages	9
Journal	Applied optics
Volume	58
Issue number	22
DOIs	https://doi.org/10.1364/AO.58.005883
Publication status	Published - 2019

Bibliographical note

Publisher Copyright:
© 2019 Optical Society of America

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics
Engineering (miscellaneous)
Electrical and Electronic Engineering

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10.1364/AO.58.005883

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@article{49afb1f7ec6d424984b5587e19cba1dc,

title = "Residual modulation reduction in optical sectioning using a suitable spatial light modulator waveform",

abstract = "We propose a method to improve the axial response of structured illumination microscopy via selection of an illumination pattern with a sinusoidal or square wave within the cutoff frequency of the imaging system. Residual modulation within a sectioned image is mitigated by accurate phase-shifting via the electrical spatial light modulator control signal, which is based on an illumination pattern having a suitable waveform. Reduction in residual modulation is observed in the sinusoidal pattern with a spatial frequency sufficiently below the cutoff frequency of the imaging system. This reduction is larger for the square wave as the spatial frequency approaches one-third of the cutoff frequency.",

author = "Han, {Jeong Heon} and Yoo, {Nak Won} and Kim, {Myung Ha} and Ju, {Byeong Kwon} and Park, {Min Chul}",

note = "Publisher Copyright: {\textcopyright} 2019 Optical Society of America",

year = "2019",

doi = "10.1364/AO.58.005883",

language = "English",

volume = "58",

pages = "5883--5891",

journal = "Applied optics",

issn = "1559-128X",

publisher = "Optica Publishing Group",

number = "22",

}

TY - JOUR

T1 - Residual modulation reduction in optical sectioning using a suitable spatial light modulator waveform

AU - Han, Jeong Heon

AU - Yoo, Nak Won

AU - Kim, Myung Ha

AU - Ju, Byeong Kwon

AU - Park, Min Chul

PY - 2019

Y1 - 2019

N2 - We propose a method to improve the axial response of structured illumination microscopy via selection of an illumination pattern with a sinusoidal or square wave within the cutoff frequency of the imaging system. Residual modulation within a sectioned image is mitigated by accurate phase-shifting via the electrical spatial light modulator control signal, which is based on an illumination pattern having a suitable waveform. Reduction in residual modulation is observed in the sinusoidal pattern with a spatial frequency sufficiently below the cutoff frequency of the imaging system. This reduction is larger for the square wave as the spatial frequency approaches one-third of the cutoff frequency.

AB - We propose a method to improve the axial response of structured illumination microscopy via selection of an illumination pattern with a sinusoidal or square wave within the cutoff frequency of the imaging system. Residual modulation within a sectioned image is mitigated by accurate phase-shifting via the electrical spatial light modulator control signal, which is based on an illumination pattern having a suitable waveform. Reduction in residual modulation is observed in the sinusoidal pattern with a spatial frequency sufficiently below the cutoff frequency of the imaging system. This reduction is larger for the square wave as the spatial frequency approaches one-third of the cutoff frequency.

UR - http://www.scopus.com/inward/record.url?scp=85072014573&partnerID=8YFLogxK

U2 - 10.1364/AO.58.005883

DO - 10.1364/AO.58.005883

M3 - Article

C2 - 31503934

AN - SCOPUS:85072014573

SN - 1559-128X

VL - 58

SP - 5883

EP - 5891

JO - Applied optics

JF - Applied optics

IS - 22

ER -

Residual modulation reduction in optical sectioning using a suitable spatial light modulator waveform

Abstract

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