Abstract
We propose a method to improve the axial response of structured illumination microscopy via selection of an illumination pattern with a sinusoidal or square wave within the cutoff frequency of the imaging system. Residual modulation within a sectioned image is mitigated by accurate phase-shifting via the electrical spatial light modulator control signal, which is based on an illumination pattern having a suitable waveform. Reduction in residual modulation is observed in the sinusoidal pattern with a spatial frequency sufficiently below the cutoff frequency of the imaging system. This reduction is larger for the square wave as the spatial frequency approaches one-third of the cutoff frequency.
Original language | English |
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Pages (from-to) | 5883-5891 |
Number of pages | 9 |
Journal | Applied optics |
Volume | 58 |
Issue number | 22 |
DOIs | |
Publication status | Published - 2019 |
Bibliographical note
Publisher Copyright:© 2019 Optical Society of America
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics
- Engineering (miscellaneous)
- Electrical and Electronic Engineering