Residual modulation reduction in optical sectioning using a suitable spatial light modulator waveform

Jeong Heon Han, Nak Won Yoo, Myung Ha Kim, Byeong Kwon Ju, Min Chul Park

    Research output: Contribution to journalArticlepeer-review

    Abstract

    We propose a method to improve the axial response of structured illumination microscopy via selection of an illumination pattern with a sinusoidal or square wave within the cutoff frequency of the imaging system. Residual modulation within a sectioned image is mitigated by accurate phase-shifting via the electrical spatial light modulator control signal, which is based on an illumination pattern having a suitable waveform. Reduction in residual modulation is observed in the sinusoidal pattern with a spatial frequency sufficiently below the cutoff frequency of the imaging system. This reduction is larger for the square wave as the spatial frequency approaches one-third of the cutoff frequency.

    Original languageEnglish
    Pages (from-to)5883-5891
    Number of pages9
    JournalApplied optics
    Volume58
    Issue number22
    DOIs
    Publication statusPublished - 2019

    Bibliographical note

    Publisher Copyright:
    © 2019 Optical Society of America

    ASJC Scopus subject areas

    • Atomic and Molecular Physics, and Optics
    • Engineering (miscellaneous)
    • Electrical and Electronic Engineering

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