Riemannian Variance Filtering: An Independent Filtering Scheme for Statistical Tests on Manifold-Valued Data

Ligang Zheng, Hyunwoo J. Kim, Nagesh Adluru, Michael A. Newton, Vikas Singh

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

Performing large scale hypothesis testing on brain imaging data to identify group-wise differences (e.g., between healthy and diseased subjects) typically leads to a large number of tests (one per voxel). Multiple testing adjustment (or correction) is necessary to control false positives, which may lead to lower detection power in detecting true positives. Motivated by the use of socalled 'independent filtering' techniques in statistics (for genomics applications), this paper investigates the use of independent filtering for manifold-valued data (e.g., Diffusion Tensor Imaging, Cauchy Deformation Tensors) which are broadly used in neuroimaging studies. Inspired by the concept of variance of a Riemannian Gaussian distribution, a type of non-specific data-dependent Riemannian variance filter is proposed. In practice, the filter will select a subset of the full set of voxels for performing the statistical test, leading to a more appropriate multiple testing correction. Our experiments on synthetic/simulated manifoldvalued data show that the detection power is improved when the statistical tests are performed on the voxel locations that 'pass' the filter. Given the broadening scope of applications where manifold-valued data are utilized, the scheme can serve as a general feature selection scheme.

Original languageEnglish
Title of host publicationProceedings - 30th IEEE Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2017
PublisherIEEE Computer Society
Pages699-708
Number of pages10
ISBN (Electronic)9781538607336
DOIs
Publication statusPublished - 2017 Aug 22
Externally publishedYes
Event30th IEEE Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2017 - Honolulu, United States
Duration: 2017 Jul 212017 Jul 26

Publication series

NameIEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
Volume2017-July
ISSN (Print)2160-7508
ISSN (Electronic)2160-7516

Conference

Conference30th IEEE Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2017
Country/TerritoryUnited States
CityHonolulu
Period17/7/2117/7/26

ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition
  • Electrical and Electronic Engineering

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