Short Word-Line Pulse with Fast Bit-Line Boosting for High Throughput 6T SRAM-based Compute In-memory Design

Minseo Kim, Jongsun Park

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In order to get over the read disturbance in SRAM-based Compute In-Memory (CIM), 6T SRAM bit-cell with underdrived Word-Line (WL) has been widely adopted. However, underdrived WL suffers from slower Bit-Line (BL) discharge, which eventually increases the CIM latency. In this paper, we propose a short WL pulse with fast BL boosting technique. Short WL pulse approach can efficiently reduce the read disturbance while BL is discharged through BL boosting circuit so that fast BL discharging time is guaranteed with little area overhead and higher reliability. 6T SRAM bit-cell array with BL boosting has been implemented in CMOS 28nm process, and the discharging time is decreased by 63.0% compared to the conventional WL underdrive technique.

Original languageEnglish
Title of host publicationProceedings - International SoC Design Conference 2021, ISOCC 2021
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages103-104
Number of pages2
ISBN (Electronic)9781665401746
DOIs
Publication statusPublished - 2021
Event18th International System-on-Chip Design Conference, ISOCC 2021 - Jeju Island, Korea, Republic of
Duration: 2021 Oct 62021 Oct 9

Publication series

NameProceedings - International SoC Design Conference 2021, ISOCC 2021

Conference

Conference18th International System-on-Chip Design Conference, ISOCC 2021
Country/TerritoryKorea, Republic of
CityJeju Island
Period21/10/621/10/9

Bibliographical note

Funding Information:
This work was supported by National R&D Program through the National Research Foundation of Korea funded by Ministry of Science and ICT (NRF-2020M3F3A2A01082591).

Publisher Copyright:
© 2021 IEEE.

Keywords

  • BL Boosting
  • Read Disturbance
  • Short WL

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Information Systems
  • Hardware and Architecture
  • Electrical and Electronic Engineering

Fingerprint

Dive into the research topics of 'Short Word-Line Pulse with Fast Bit-Line Boosting for High Throughput 6T SRAM-based Compute In-memory Design'. Together they form a unique fingerprint.

Cite this