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Sige HBT performance and reliability trends through fT of 350GHz
- Greg Freeman*
- , Jae Sung Rieh
- , Basanth Jagannathan
- , Zhijian Yang
- , Fernando Guarin
- , Alvin Joseph
- , David Ahlgren
*Corresponding author for this work
Research output: Contribution to journal › Conference article › peer-review
14
Citations
(Scopus)