Abstract
Recent improvements in highly efficient crystalline silicon (c-Si) solar cells have relied on surface passivation. Hydrogen plays a crucial role in the surface passivation of silicon heterojunction (SHJ) solar cells because Si-H bonds passivate dangling bonds in amorphous silicon and on the c-Si surface. In this work, we demonstrate that the Si-H bonding configuration is modified by layer stacking sequence for SHJs. The quality of surface passivation strongly correlates with low-temperature hydrogen effusion from the SHJ structure. Our results show that the deposition of doped layers on intrinsic amorphous silicon supplies additional hydrogen to the amorphous/crystalline heterostructure. Moreover, the deposition of a p-layer modifies the microstructure of the intrinsic layer underneath, whereas depositing an n-layer does not induce structural changes. We suggest that the low-temperature hydrogen effusion characteristics can be used as a sensitive indicator for examining the passivation quality of SHJ solar cells.
Original language | English |
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Pages (from-to) | 15029-15037 |
Number of pages | 9 |
Journal | ACS Applied Energy Materials |
Volume | 5 |
Issue number | 12 |
DOIs | |
Publication status | Published - 2022 Dec 26 |
Bibliographical note
Publisher Copyright:© 2022 American Chemical Society. All rights reserved.
Keywords
- amorphous silicon
- hydrogen
- hydrogen exodiffusion
- low-temperature hydrogen effusion
- silicon heterojunction solar cells
- surface passivation
ASJC Scopus subject areas
- Chemical Engineering (miscellaneous)
- Energy Engineering and Power Technology
- Electrochemistry
- Materials Chemistry
- Electrical and Electronic Engineering