Abstract
A system of simple coordinate markers has been developed to facilitate the identification of individual synthetic nanofibers adsorbed on a substrate. The markers are deposited by electron beam lithography and allow to locate any spot on an atomic force microscope image and to deposit new structures close to this spot, such as lithographic contacts to nanotubes. As a demonstration, current-voltage characteristics of a junction between a metallic carbon nanotube and an n-type V2O5 nanofiber were recorded.
Original language | English |
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Pages (from-to) | 3497-3499 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 79 |
Issue number | 21 |
DOIs | |
Publication status | Published - 2001 Nov 19 |
Externally published | Yes |
Bibliographical note
Copyright:Copyright 2005 Elsevier Science B.V., Amsterdam. All rights reserved.
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)