Simple methods for measuring the linewidth enhancement factor in external cavity laser diodes

Yun Sup Shin, Tai Hyun Yoon, Jong Rak Park, Chang Hee Nam

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Abstract

We introduce two simple methods, a current scanning method and a reflectivity scanning method, for measuring the linewidth enhancement factor (α) in an external cavity laser diode (ECLD). Both methods utilize the functional relationship associated with α between the emission wavelength and effective reflectivity of the compound cavity of ECLD. The change of emission wavelength as a function of an injection current and of an external reflectivity is used to determine the value of α in the current scanning method and in the reflectivity scanning method, respectively. The measured values of α by the two methods showed a fairly good agreement.

Original languageEnglish
Pages (from-to)303-309
Number of pages7
JournalOptics Communications
Volume173
Issue number1-6
DOIs
Publication statusPublished - 2000 Jan
Externally publishedYes

Bibliographical note

Funding Information:
This research was supported in part by the Korea Research Institute of Standards and Science under Contract. No. KRISS-98-0401-005. One of the authors (Y.S.S.) gratefully acknowledges Mr. K. Okumura and Dr. A. Onae of NRLM, Japan, for their advice and help.

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Physical and Theoretical Chemistry
  • Electrical and Electronic Engineering

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