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Simultaneous measurement of thermal conductivity and interface thermal conductance of diamond thin film
Byeonghee Lee
, Joon Sik Lee
, Sun Ung Kim
, Kyeongtae Kim
,
Ohmyoung Kwon
*
, Seungkoo Lee
, Jong Hoon Kim
, Dae Soon Lim
*
Corresponding author for this work
Research output
:
Contribution to journal
›
Article
›
peer-review
12
Citations (Scopus)
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Keyphrases
Thermal Conductivity
100%
Simultaneous Measurement
100%
Diamond Film
100%
Interface Thermal Conductance
100%
Thermal Interface
100%
Diamond Thin Films
100%
Silicon Dioxide
50%
Silicon Nitride Film
50%
Sample Pretreatment
50%
Metal Strip
50%
High Thermal Conductivity
50%
In-plane Thermal Conductivity
50%
Open Atmosphere
50%
Chemical Vapor Deposited Diamond
50%
Engineering
Thin Films
100%
Thermal Conductivity
100%
Diamond
100%
Pretreatment
33%
Nitride
33%
High Thermal Conductivity
33%
Silicon Dioxide
33%
Chemical Engineering
Thermal Conductivity
100%
Film
100%
Silica
14%
Silicon Nitride
14%