Abstract
Semiconductor “sinusoidal superlattices” of (Formula presented)—that is, periodic structures in which the chemical composition parametrized by x varies sinusoidally along one direction—were fabricated by rotating a substrate through an inhomogeneous distribution of constituent fluxes within a molecular beam epitaxy growth chamber. The modulation of chemical composition x is accompanied by modulation of strain, owing to the difference in Zn-Se and Zn-Te bond lengths. By fitting x-ray diffraction scans around the (002), (004), and (006) Bragg reflections for (001)-oriented (Formula presented) sinusoidal superlattices to a simple scattering theory, we have determined both the strain and the chemical modulation amplitudes in these structures.
Original language | English |
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Pages (from-to) | 8388-8392 |
Number of pages | 5 |
Journal | Physical Review B - Condensed Matter and Materials Physics |
Volume | 61 |
Issue number | 12 |
DOIs | |
Publication status | Published - 2000 |
Externally published | Yes |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics