Abstract
The effect of SiO2 impurity on the grain-boundary conduction in Sr- and Mg-doped lanthanum gallate (La0.8 Sr0.2 Ga 0.8 Mg0.2 O3-δ, LSGM) was studied. The grain-boundary conduction of LSGM was slightly affected, even by the addition of 500-2000 ppm SiO2, while the apparent grain-boundary resistivity was increased up to ∼780 times in gadolinia-doped ceria by the doping of 500-2000 ppm SiO2. The high tolerance of the grain-boundary conduction against siliceous impurity in the LSGM specimen was explained by the gathering of the acidic siliceous phase near the basic SrO component.
Original language | English |
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Pages (from-to) | B28-B31 |
Journal | Electrochemical and Solid-State Letters |
Volume | 13 |
Issue number | 3 |
DOIs | |
Publication status | Published - 2010 |
ASJC Scopus subject areas
- General Chemical Engineering
- General Materials Science
- Physical and Theoretical Chemistry
- Electrochemistry
- Electrical and Electronic Engineering