Soft-type trap-induced degradation of MoS₂ field effect transistors

Keyphrases

• Carrier number Fluctuations 66%
• Correlated Mobility 66%
• Current Power 33%
• Density-based 33%
• Dielectric Oxide 33%
• Drain Current 100%
• Electronic Devices 33%
• Field-effect Transistors 66%
• Fluctuation Model 33%
• Induced Degradation 100%
• Molybdenite 33%
• MoS2 Field Effect Transistors 100%
• Multilayer Fields 33%
• Noise Current 33%
• Power Spectrum 33%
• Practical Applicability 33%
• Semiconductors 33%
• Stress-driven 33%
• Stress-Induced Degradation 33%
• Transistor 33%
• Trap Density 33%

Engineering

• Applicability 25%
• Current Drain 75%
• Dielectrics 25%
• Field-Effect Transistor 100%
• Induced Degradation 100%
• Initial State 25%
• Initial Value 25%
• Molybdenum Disulfide 100%
• Power Spectra 25%

Material Science

• Density 25%
• Dielectric Material 25%
• Field Effect Transistor 100%
• Oxide Compound 25%
• Transistor 25%