Software-based analysis of radio frequency plasma display panel for efficient design and impedance matching

Ki Hyuk Kim; H. I. Park; J. H. Park; Sung Woo Hwang; J. Kang

doi:10.1109/6144.926394

Software-based analysis of radio frequency plasma display panel for efficient design and impedance matching

Ki Hyuk Kim, H. I. Park, J. H. Park, Sung Woo Hwang, J. Kang

School of Electrical Engineering

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

A full software analysis technique for the radio frequency (RF) plasma display panel (PDP) has been developed. The RF PDT test panel has been analyzed by the segmentation/three-dimensional (3-D) parameter extraction/SPICE simulation scheme, which was originally developed for the analysis of RF complimentary metal oxide semiconductor (CMOS) chips. Our technique is shown to be accurate in predicting the input impedance of the RF port and the calculated input impedance is used to perform impedance matching of the system. The technique is also extendable to a much larger size RF-PDP and has the possibility of being applied to the design and analysis of various interesting RF system and components.

Original language	English
Pages (from-to)	279-283
Number of pages	5
Journal	IEEE Transactions on Components and Packaging Technologies
Volume	24
Issue number	2
DOIs	https://doi.org/10.1109/6144.926394
Publication status	Published - 2001 Jun

Keywords

Impedance matching
Plasma display panel
RF
SPICE
Software analysis

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

Access to Document

10.1109/6144.926394

Cite this

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title = "Software-based analysis of radio frequency plasma display panel for efficient design and impedance matching",

abstract = "A full software analysis technique for the radio frequency (RF) plasma display panel (PDP) has been developed. The RF PDT test panel has been analyzed by the segmentation/three-dimensional (3-D) parameter extraction/SPICE simulation scheme, which was originally developed for the analysis of RF complimentary metal oxide semiconductor (CMOS) chips. Our technique is shown to be accurate in predicting the input impedance of the RF port and the calculated input impedance is used to perform impedance matching of the system. The technique is also extendable to a much larger size RF-PDP and has the possibility of being applied to the design and analysis of various interesting RF system and components.",

keywords = "Impedance matching, Plasma display panel, RF, SPICE, Software analysis",

author = "Kim, {Ki Hyuk} and Park, {H. I.} and Park, {J. H.} and Hwang, {Sung Woo} and J. Kang",

note = "Funding Information: Manuscript received January 31, 2001; revised February 26, 2001. This work was supported by LG Electronics, Inc., Korea and the Brain Korea 21 Project in 2000. This work was recommended for publication by Associate Editor A. Deutsch upon evaluation of the reviewers{\textquoteright} comments.",

year = "2001",

month = jun,

doi = "10.1109/6144.926394",

language = "English",

volume = "24",

pages = "279--283",

journal = "IEEE Transactions on Components and Packaging Technologies",

issn = "1521-3331",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

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T1 - Software-based analysis of radio frequency plasma display panel for efficient design and impedance matching

AU - Kim, Ki Hyuk

AU - Park, H. I.

AU - Park, J. H.

AU - Hwang, Sung Woo

AU - Kang, J.

N1 - Funding Information: Manuscript received January 31, 2001; revised February 26, 2001. This work was supported by LG Electronics, Inc., Korea and the Brain Korea 21 Project in 2000. This work was recommended for publication by Associate Editor A. Deutsch upon evaluation of the reviewers’ comments.

PY - 2001/6

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N2 - A full software analysis technique for the radio frequency (RF) plasma display panel (PDP) has been developed. The RF PDT test panel has been analyzed by the segmentation/three-dimensional (3-D) parameter extraction/SPICE simulation scheme, which was originally developed for the analysis of RF complimentary metal oxide semiconductor (CMOS) chips. Our technique is shown to be accurate in predicting the input impedance of the RF port and the calculated input impedance is used to perform impedance matching of the system. The technique is also extendable to a much larger size RF-PDP and has the possibility of being applied to the design and analysis of various interesting RF system and components.

AB - A full software analysis technique for the radio frequency (RF) plasma display panel (PDP) has been developed. The RF PDT test panel has been analyzed by the segmentation/three-dimensional (3-D) parameter extraction/SPICE simulation scheme, which was originally developed for the analysis of RF complimentary metal oxide semiconductor (CMOS) chips. Our technique is shown to be accurate in predicting the input impedance of the RF port and the calculated input impedance is used to perform impedance matching of the system. The technique is also extendable to a much larger size RF-PDP and has the possibility of being applied to the design and analysis of various interesting RF system and components.

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KW - Plasma display panel

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KW - SPICE

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Software-based analysis of radio frequency plasma display panel for efficient design and impedance matching

Abstract

Keywords

ASJC Scopus subject areas

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