Abstract
In the micro process such as semiconductor process, Variation of variables directly affects the quality of the end product. So, it is important to monitor and manage the fluctuations in the variable. At this time, the signal is generated. However, the signal has a moving average and non-uniform variance, and different lengths in specific portion. Also it has a different total length. Recently, the DTW(Dynamic Time Warping) is used to coordinate of signal. However, the mean and variance of the signal is not uniform, there arises a problem that the singularity occurs. Singularity means unintuitive alignments that single point in time series connects onto a portion of another time series. To solve the problem that the singularity occurs, in this paper, we propose to use MODWT (Maximal Overlap Discrete Wavelet Transform) as a feature of signal and then calculate the warping path using divided matrices. We solve the singularity problem when applying the DTW to process the signal. Also, by comparing the result of applying process signal to DTW and proposed method, the proposed method is confirmed to be better than DTW in process signal.
Original language | English |
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Title of host publication | Proceedings - IEEE 11th International Conference on Semantic Computing, ICSC 2017 |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 266-267 |
Number of pages | 2 |
ISBN (Electronic) | 9781509048960 |
DOIs | |
Publication status | Published - 2017 Mar 29 |
Event | 11th IEEE International Conference on Semantic Computing, ICSC 2017 - San Diego, United States Duration: 2017 Jan 30 → 2017 Feb 1 |
Other
Other | 11th IEEE International Conference on Semantic Computing, ICSC 2017 |
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Country/Territory | United States |
City | San Diego |
Period | 17/1/30 → 17/2/1 |
Keywords
- Dynamic time warping
- Maximal overlap discrete wavelet transform
- Semiconductor process signal
- Singularity
ASJC Scopus subject areas
- Computer Science Applications
- Information Systems
- Computer Networks and Communications