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Keyphrases
3D Device Simulation
20%
Cell Transistor
100%
Channel Region
20%
Channel Type
100%
Charge Pumping Method
20%
Device Design
20%
Doping Concentration
20%
Drain Doping
20%
Dynamic Random Access Memory
100%
Future Dynamics
20%
Gate Oxide Thickness
20%
Gate Stress
40%
Interface Traps
100%
Lateral Distribution
20%
Lateral Profiling
20%
Memory Cell
100%
Memory Device
20%
Model Dynamics
20%
Overlapping Region
20%
Recessed Channel
20%
Spatial Distribution
100%
Thickness Profile
20%
Typing Dynamics
100%
Engineering
Channel Region
20%
Dynamic Random Access Memory
100%
Experimental Result
20%
Gate Oxide
20%
Interface Trap
100%
Oxide Thickness
20%
Random Access Memory Device
20%
Spatial Distribution
100%
Structure Type
20%
Transistor
100%
Earth and Planetary Sciences
Oxide
20%
Random Access Memory
100%
Spatial Distribution
100%
Transistor
100%
Physics
Oxide
25%
Spatial Distribution
100%
Transistor
100%
Immunology and Microbiology