ssEMnet: Serial-section electron microscopy image registration using a spatial transformer network with learned features
- Inwan Yoo
- , David G.C. Hildebrand
- , Willie F. Tobin
- , Wei Chung Allen Lee
- , Won Ki Jeong*
*Corresponding author for this work
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
58
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(Scopus)